Search records | 東京工業大学附属図書館文献データベース

You can search for articles included in proceedings of international conferences and technical papers which Tokyo Tech Library holds.
Tokyo Tech members can obtain tables of contents of 17,000 foreign journals by SwetScan. Tokyo Tech Library does not cover all of them.
List of Searchable Databases

Clear Form

Search for other sites by same keyword(s).

CiNii Books

NDL Search

WebcatPlus

amazon

カーリル

WorldCat

Filter

Title:

Author:

ISBN / ISSN / Paper No:

Source Title:

Publisher:

Publication Year:

～

Clear Form

Type:

Conference Proceedings

Technical Paper

Academic Journal

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

26 results

Conference Proceedings

1. Fast inspection of radius,wall thickness,eccentricity,and ovality at the end of high-precision tubes:TRUDE 60-28 in production

Kleuver,W. ; Weber,J. ; Justen,D. ; Hartmann,K.

Pub. info.:	Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG. pp.340-348, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3100

Conference Proceedings

2. Surface inspection of transparent materials with a compact reflection sensor

Koscheck,M. ; Kleuver,W. ; Weber,J. ; Hartmann,K.

Pub. info.:	Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG. pp.357-365, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3100

Conference Proceedings

3. Interaction of a copper-induced defect with shallow acceptors and deep centers in silicon

Prescha,Th. ; Weber,J.

Pub. info.:	Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991. Pt.1 pp.167-172, 1992. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	83-87

Conference Proceedings

4. Diffusion and drift of hydrogen in Si and GaAs

Leitch,A.W.R. ; Zundel,T. ; Prescha,Th. ; Weber,J.

Pub. info.:	Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991. Pt.1 pp.21-26, 1992. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	83-87

Conference Proceedings

5. Processing of mercurous chloride in space

Watson,C. ; Singh,N.B. ; Thomas,A. ; Nelson,A. E. ; Rolin,T. O. ; Griffin,J. ; Haulenbeek,G. ; Daniel,N. ; Seaquist,J. ; Cacioppo,C. ; Weber,J. ; Zugrav,M. I. ; Naumann,R. J.

Pub. info.:	Materials research in low gravity : 28-29 July 1997, San Diego, California. pp.22-33, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3123

Conference Proceedings

6. Flexible calibration method for an image-guided 3D laser radar scanner applicable for large volumina

Weber,J.

Pub. info.:	Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG. pp.39-50, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3100

Conference Proceedings

7. Multisensor system for surface inspection and 3D geometry assessment

Becker,M. ; Weber,J. ; Schubert,E.

Pub. info.:	Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG. pp.51-61, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3100

Conference Proceedings

8. Infrared Absorption Lines in Hydrogen-Plasma Treated Se-Doped GaAs

Svensson,J.H. ; Weber,J.

Pub. info.:	Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992. pp.309-314, 1993. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	117-118

Conference Proceedings

9. Photoluminescence centres associated with noble-gas impurities in silicon

Estreicher,S.K. ; Weber,J.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part1 pp.605-610, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

10.

Conference Proceedings

10. Manganese Levels in GaAs under Hydrostatic Pressure,in AlGaAs,and in GaAs/AIGaAs Quantum Wells

Bantien,F. ; Hofmann,G. ; Reimann,K. ; Weber,J.

Pub. info.:	Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988. Part3 pp.1403-1408, 1989. Aederlmannsdorf, Switzwelns. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	38-41

26 results

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

Filtering by:

Author: Weber,J.