Bartzsch, H. ; Frach, P. ; Weber, J. ; Liebig, J. -S.
Pub. info.:
Advances in optical thin films II : 13-15 September 2005, Jena, Germany. pp.59631B-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Weber, J. ; Schulz, U. ; Kaiser, N. ; Bartzsch, H. ; Frach, P.
Pub. info.:
Advances in optical thin films II : 13-15 September 2005, Jena, Germany. pp.596327-596327, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Finger, F. ; Viret, V. ; Shah, A. ; Tang, X.-M. ; Weber, J. ; Beyer, W.
Pub. info.:
Amorphous silicon technology, 1990 : symposium held April 17-20, 1990, San Francisco, California, U.S.A.. pp.583-588, 1990. Pittsburgh, Pa.. Materials Research Society
Guenther, M. ; Gerlach, G. ; Kuckling, D. ; Kretschmer, K. ; Corten, C. ; Weber, J. ; Sorber, J. ; Suchaneck, G. ; Arndt, K.-F.
Pub. info.:
Smart structures and materials 2006 : Smart sensor monitoring systems and applications : 27 February-1 March 2006, San Diego, California, USA. pp.61670T-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sveinbjoernsson, E.OE. ; Bengtsson, St. ; Weber, J. ; Keskitalo, N.
Pub. info.:
Proceedings of the Fourth International Symposium on Semiconductor Wafer Bonding : science, technology, and applications. pp.264-271, 1997. Pennington, NJ. Electrochemical Society
Bertagnolli, E. ; Dollmann, D. ; Braun, R. ; Buchner, R. ; Engelhardt, M. ; Grassl, T. ; Hieber, K. ; Kawala, G. ; Kleiner, M. ; Klump, A. ; Kuehn, S. ; Landesberger, C. ; Pamler, W. ; Popp, R. ; Ramm, P. ; Renner, E. ; Ruhl, G. ; Saenger, A. ; Scheler, U. ; Schmidt, C. ; Schwarzl, S. ; Weber, J.
Pub. info.:
Proceedings of the Fourth International Symposium on Semiconductor Wafer Bonding : science, technology, and applications. pp.509-520, 1997. Pennington, NJ. Electrochemical Society
Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.443-448, 1990. Pittsburgh, Pa.. Materials Research Society
Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.325-330, 1988. Pittsburgh, Pa.. Materials Research Society