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Conference Proceedings

1. Effect of Mg, Zn, Si, and O on the Lattice Constant of Gallium Nitride Thin Films

Sudhir, G. S. ; Peyrot, Y. ; Kruger, J. ; Kim, Y. ; Klockenbrink, R. ; Kisielowski, C. ; Rubin, M. D. ; Weber, E. R. ; Kriegseis, W. ; Meyer, B. K.

Pub. info.:	Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.525-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	482

Conference Proceedings

2. Localized Donors in GaN: Spectroscopy Using Large Pressures

Wetzel, C. ; Amano, H. ; Akasaki, I. ; Suski, T. ; Ager, J. W. ; Weber, E. R. ; Haller, E. E. ; Meyer, B. K.

Pub. info.:	Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.489-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	482

Conference Proceedings

3. LATTICE RELAXATION OF THE DX CENTERS IN Ga1-XAlXAs AND OF THE PRESSURE-INDUCED DEEP DONORS IN GaAs

Li, M. F. ; Shan, W. ; Yu, P. Y. ; Hansen, W. L. ; Weber, E. R. ; Bauser, E.

Pub. info.:	Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.573-578, 1988. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	104

Conference Proceedings

4. SURFACE FACETING OF (110) GaAs: ANALYSIS AND ELIMINATION

Parechianian-Allen, L. ; Weber, E. R. ; Washburn, J. ; Pao, Y. C.

Pub. info.:	Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A.. pp.487-492, 1987. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	82

Conference Proceedings

5. THE INFLUENCE OF CURRENT STRESSING ON THE STRUCTURE OF Ag CONTACTS TO GaAs

Liliental-Weber, Z. ; Miret-Goutier, A. ; Newman, N. ; Jou, C. ; Spicer, W. E. ; Washburn, J. ; Weber, E. R.

Pub. info.:	Epitaxy of semiconductor layered structures : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A.. pp.241-244, 1988. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	102

Conference Proceedings

6. GROWTH OF (110) GaAs/GaAs BY MOLECULAR BEAM EPITAXY

Parechanian, L. T. ; Weber, E. R. ; Hierl, T. L.

Pub. info.:	Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.391-396, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	46

Conference Proceedings

7. THE FORMATION OF AMORPHOUS SILICON BY LIGHT ION DAMAGE

Shih, Y. ; Washburn, J. ; Weber, E. R. ; Gronsky, R.

Pub. info.:	Ion beam processes in advanced electronic materials and device technology : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.65-70, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	45

Conference Proceedings

8. DIFFUSION, COMPLEXING AND PRECIPITATION OF TRANSITION METALS IN SILICON

Weber, E. R.

Pub. info.:	Impurity diffusion and gettering in silicon : symposium held November 27-30, 1984, Boston, Massachusetts, U.S.A.. pp.3-12, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	36

Conference Proceedings

9. TRANSITION METAL CONTAMINATION OF EPITAXIAL SILICON

Scott, M. P. ; Caubin, L. ; Chen, D. C. ; Weber, E. R. ; Rose, J. ; Tucker, T.

Pub. info.:	Impurity diffusion and gettering in silicon : symposium held November 27-30, 1984, Boston, Massachusetts, U.S.A.. pp.37-42, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	36

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Conference Proceedings

10. THE THERMAL STABILITY OF HEAVILY CARBON-DOPED GaAs GROWN BY METALORGANIC MOLECULAR BEAM EPITAXY

Sohn, Hyunchul ; Weber, E. R. ; Nozaki, S. ; Konagal, M. ; Takahashi, K.

Pub. info.:	Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A.. pp.129-134, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	262

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Author: Weber, E. R.