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19 results

Conference Proceedings

1. Frenkel Pairs on the Te Sublattice of ZnTe? An ODMR Study

Ittermann,B. ; Koschnick,F.K. ; Barry,W.A. ; Burnard,M.J. ; Watkins,G.D.

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.1 pp.423-428, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

Conference Proceedings

2. Reorientation of stress induced alignment of thermal double donors in silicon

Wagner,P. ; Hage,J. ; Trombetta,J.M. ; Watkins,G.D.

Pub. info.:	Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991. Pt.1 pp.401-406, 1992. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	83-87

Conference Proceedings

3. Generation of anion-antisite defects in n-type,p-type and semi-insulating InP studied by MCD-ODMR and MCD-ODENDOR

Gislason,H.P. ; Sun,H. ; Peale,R.E. ; Watkins,G.D.

Pub. info.:	Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991. Pt.2 pp.905-910, 1992. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	83-87

Conference Proceedings

4. Configurational metastability carbon-phosphorus pair defects in sillicon

Gurer,E. ; Benson,B.W. ; Watkins,G.D.

Pub. info.:	Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991. Pt.1 pp.339-344, 1992. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	83-87

Conference Proceedings

5. EPR study of multi-stable Ci-P.in silicon

Zhan,X.D. ; Watkins,G.D.

Pub. info.:	Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991. Pt.1 pp.345-350, 1992. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	83-87

Conference Proceedings

6. Characterization of an Anion Antisite Defect as a Deep Double Donor in InP

Ando,K. ; Katsui,A. ; Jeon,D.Y. ; Watkins,G.D. ; Gislason,H.P.

Pub. info.:	Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988. Part2 pp.761-768, 1989. Aederlmannsdorf, Switzwelns. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	38-41

Conference Proceedings

7. The Structure of a Metastable Luminescent Defect in Sulphur-doped Silicon

Singh,M. ; Davies,G. ; Lightowlers,E.C. ; Watkins,G.D.

Pub. info.:	Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992. pp.141-146, 1993. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	117-118

Conference Proceedings

8. 35 Years of Defects in Semiconductors:What Next?

Watkins,G.D.

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.1 pp.9-18, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

Conference Proceedings

9. Passivation of shallow acceptors in Si and GaAs by annealing in H2

Veloarisoa,I.A. ; Kozuch,D.M. ; Stavola,M. ; Peale,R.E. ; Watkins,G.D. ; Pearton,S.J. ; Abernathy,C.R. ; Hobson,W.S.

Pub. info.:	Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991. Pt.1 pp.111-118, 1992. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	83-87

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Conference Proceedings

10. Spectroscopic Identification of a Transition Metal-H Complex in Silicon

Williams,P.M. ; Watkins,G.D. ; Ufiring,S. ; Stavola,M.

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.2 pp.891-896, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

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Author: Watkins,G.D.