1.

Conference Proceedings
Conference Proceedings
1. X-ray stepper development for volume production at Canon
Uda,K. ; Mizusawa,N. ; Tanaka,Y. ; Watanabe,Y. ; Ina,H. ; Uzawa,S.
Pub. info.: Emerging lithographic technologies II : 23-25 February 1998, Santa Clara, California.  pp.689-697,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3331
2.

Conference Proceedings
Conference Proceedings
2. Minimization of artifacts due to surface effects in laser CT images reconstructed by FBP method
Watanabe,Y. ; Yuasa,T. ; Devaraj,B. ; Akatsuka,T. ; Inaba,H.
Pub. info.: Proceedings of coherence domain optical methods in biomedical science and clinical applications III : 27-29 January 1999, San Jose, California.  pp.130-139,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3598
3.

Conference Proceedings
Conference Proceedings
3. Algebraic reconstruction for transmission optical CT based on coherent detection imaging method
Yuasa,T. ; Watanabe,Y. ; Devaraj,B. ; Akatsuka,T. ; Inaba,H.
Pub. info.: Proceedings of coherence domain optical methods in biomedical science and clinical applications III : 27-29 January 1999, San Jose, California.  pp.242-252,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3598
4.

Conference Proceedings
Conference Proceedings
4. TOMS ozone data analysis of Indonesian forest fire effect on total ozone
Niu,J. ; Watanabe,Y. ; Takeuchi,N. ; Ogawa,T.
Pub. info.: Optical remote sensing of the atmosphere and clouds : 15-17 September 1998, Beijing, China.  pp.313-320,  1998.  Bellingham.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3501
5.

Conference Proceedings
Conference Proceedings
5. Detection of Oxygen-Related Defects in Silicon Wafers by Highly Selective Reactive Ion Etching
Nakashima,K. ; Watanabe,Y. ; Yoshida,T. ; Mitsushima,Y.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.129-135,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
6.

Conference Proceedings
Conference Proceedings
6. Optical computed tomography of multiple-scattering media using laser spectral linewidth broadening
Watanabe,Y. ; Yuasa,T. ; Devaraj,B. ; Akatsuka,T. ; Inaba,H.
Pub. info.: Coherence domain optical methods in biomedical science and clinical applications IV : 24-26 January 2000, San Jose, California.  pp.97-105,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3915
7.

Conference Proceedings
Conference Proceedings
7. Current status of the SR stepper development(Invited Paper)
Mizusawa,N. ; Watanabe,Y. ; Hara,S. ; Saitoh,K. ; Maehara,H. ; Amemiya,M. ; Uzawa,S.
Pub. info.: Photomask and X-ray mask technology IV : 17-18 April, 1997, Kawasaki, Japan.  pp.230-239,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3096
8.

Conference Proceedings
Conference Proceedings
8. Multiplicity and Lattiice Relaxation of DX Center in AlGaAs:Si Studied by Electron Emission Spectra under Pressure
Takarabe,K. ; Ashizawa,H. ; Minomura,S. ; Kato,H. ; Watanabe,Y. ; Matsuda,K.
Pub. info.: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.447-452,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 117-118
9.

Conference Proceedings
Conference Proceedings
9. ESR Studies of Defects in p-Type 6H-SiC Irradiated with 3MeV-Electrons
Cha,D. ; Itoh,H. ; Morishita,N. ; Kawasuso,A. ; Ohshima,T. ; Watanabe,Y. ; Ko,J. ; Lee,K. ; Nashiyama,I.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.615-618,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
10.

Conference Proceedings
Conference Proceedings
10. Pseudo-Octagonal Quasilattice II
Watanabe,Y.
Pub. info.: Quasicrystals and imperfectly ordered crystals.  pp.167-174,  1994.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 150-151