1.

Conference Proceedings

Conference Proceedings
Wakabayashi,O. ; Sakuma,J. ; Suzuki,T. ; Kubo,H. ; Kitatochi,N. ; Suganuma,T. ; Nakaike,T. ; Kumazaki,T. ; Hotta,K. ; Mizoguchi,H. ; Nakao,K. ; Togashi,T. ; Nabekawa,Y. ; Watanabe,S.
Pub. info.: Optical Microlithography XIV.  4346  pp.1066-1073,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4346
2.

Conference Proceedings

Conference Proceedings
Yoshino,Y. ; Morishige,Y. ; Watanabe,S. ; Kyusho,Y. ; Ueda,A. ; Haneda,T. ; Oomiya,M.
Pub. info.: 20th Annual BACUS Symposium on Photomask Technology.  4186  pp.663-669,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4186
3.

Conference Proceedings

Conference Proceedings
Ueda,A. ; Yoshino,Y. ; Morishige,Y. ; Watanabe,S. ; Kyusho,Y. ; Haneda,T. ; Ohmiya,M.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology VIII.  4409  pp.574-582,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4409
4.

Conference Proceedings

Conference Proceedings
Hara,S. ; Murakami,E. ; Magoshi,S. ; Koyama,K. ; Anze,H. ; Ogawa,Y. ; Kabeya,A. ; Ooki,S. ; Saito,T. ; Fujii,T. ; Sakamoto,S. ; Suzuki,H. ; Yano,M. ; Watanabe,S.
Pub. info.: Photomask and X-Ray Mask Technology III.  pp.410-417,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2793
5.

Conference Proceedings

Conference Proceedings
Uchida,Y. ; Yamada,J. ; Higa,S. ; Kathuria,Y.P. ; Tsuboi,A. ; Watanabe,S. ; Hayashi,N. ; Furuhashi,H.
Pub. info.: International Conference on Fiber Optics and Photonics: Selected Papers from Photonics India '96.  pp.37-42,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3211
6.

Conference Proceedings

Conference Proceedings
Sunta,C.M. ; Ayta,W.E.F.Feria ; Watanabe,S.
Pub. info.: Proceedings of the 13th International Conference on Defects in Insulating Materials, ICDIM 96, July 15-19, 1996, Wake Forest University, Winston-Salem, NC 27109, USA.  pp.745-748,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 239-241
7.

Conference Proceedings

Conference Proceedings
Yoshimi,M. ; Kawanaka,S. ; Yamada,T. ; Terauchi,M. ; Shino,T. ; Fuse,T. ; Oowaki,Y. ; Watanabe,S.
Pub. info.: Microelectronic Device Technology : 1-2 October 1997, Austin, Texas.  pp.178-187,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3212
8.

Conference Proceedings

Conference Proceedings
Miura,H. ; Fujinaga,S. ; Narikiyo,T. ; Ohmori,A. ; Okino,K. ; Watanabe,S.
Pub. info.: XI International Symposium on Gas Flow and Chemical Lasers and High-Power Laser Conference : 25-30 August 1996, Heriot-Watt University, Edinburgh, UK.  pp.736-739,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3092
9.

Conference Proceedings

Conference Proceedings
Ukai,Y. ; Niki,N. ; Satoh,H. ; Watanabe,S. ; Ohmatsu,H. ; Eguchi,K. ; Moriyama,N.
Pub. info.: Medical Imaging 1999: Image Processing.  Part2  pp.1315-1323,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3661
10.

Conference Proceedings

Conference Proceedings
Ukai,Y. ; Niki,N. ; Satoh,H. ; Watanabe,S. ; Ohmatsu,H. ; Eguchi,K. ; Moriyama,N.
Pub. info.: Medical imaging 1998, Image processing : 23-26 February 1998, San Diego, California.  Part 2  pp.1482-1489,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3338