Warren, W.L. ; Kanicki, J. ; Robertson, J. ; Poindexter, E.H.
Pub. info.:
Amorphous insulating thin films : symposium held December 1-4, 1992, Boston, Massachusetts, U.S.A.. pp.101-106, 1993. Pittsburgh, Pa.. Materials Research Society
Gerardi, G.J. ; Rong, F.C. ; Poindexter, E.H. ; Harmatz, M. ; Shen, H. ; Warren, W.L.
Pub. info.:
Amorphous insulating thin films : symposium held December 1-4, 1992, Boston, Massachusetts, U.S.A.. pp.601-606, 1993. Pittsburgh, Pa.. Materials Research Society
Proceedings of the third Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films. pp.3-12, 1994. Pennington, NJ. Electrochemical Society
Better ceramics through chemistry III : symposium held April 5-8, 1988, Reno, Nevada, U.S.A.. pp.803-810, 1988. Pittsburgh, Pa.. Materials Research Society
Warren, W.L. ; Kanichi, J. ; Rong, F.C. ; Buchwald, W.R. ; Harmatz, M.
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Wide band gap semiconductors : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A.. pp.687-692, 1992. Pittsburgh, Pa.. Materials Research Society
The physics and chemistry of SiO[2] and the Si-SiO[2] interface-3, 1996 : proceedings of the Third International Symposium on the Physics and Chemistry of SiO[2] and the Si-SiO[2] Interface. pp.265-281, 1996. Pennington, NJ. Electrochemical Society
Hargrave, B. ; Irwin, B. ; Parkhill, R. ; Church, K.H. ; Nguyen, M.N. ; Kachurin, A. ; Warren, W.L.
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Smart structures and materials 2004 : smart electronics, MEMS, BioMEMS, and nanotechnology : 15-18 March 2004, San Diego, California, USA. pp.114-125, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Amorphous insulating thin films : symposium held December 1-4, 1992, Boston, Massachusetts, U.S.A.. pp.493-498, 1993. Pittsburgh, Pa.. Materials Research Society
Lasers in Surgery: Advanced Characterization, Therapeutics, and Systems XIV. pp.359-370, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering