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Conference Proceedings

1. Scanning tunneling spectroscopy investigation of the strained Si1-xGex-on-Si band offsets

Chen, Xiangdong ; Wang, Xiang-Dong ; Liu, Kou-Chen ; Kim, Dong-Won ; Banerjee, Sanjay

Pub. info.:	Morphological and compositional evolution of heteroepitaxial semiconductor thin films : symposium held April 24-27, 2000, San Francisco, California. pp.219-, 2000. Warrendale, Pennsylvania.. MRS-Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	618

Conference Proceedings

2. Characterization of High-k Dielectric Films with Tunneling AFM

Wang, Xiang-Dong ; Kulik, Joe ; Edwards, N.V. ; Samavedam, S.B. ; Lu, Shifeng

Pub. info.:	Spatially resolved characterization of local phenomena in materials and nanostructures : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.. pp.183-376, 2003. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	738

Conference Proceedings

3. Process Control of Epi-Layers for SiGe:C Hetero-Structure Bipolar Transistors

Xie, Qianghua ; Duda, Erika ; Kottke, Mike ; Qin, Wentao ; Wang, Xiang-Dong ; Lu, shifeng ; Erickson, Martha ; Kretzschmar, Heather B.

Pub. info.:	Progress in semiconductors II : electronic and optoelectronic applications : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.. pp.61-66, 2003. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	744

Conference Proceedings

4. 2D Dopant Profiling for Advanced Process Control

Wang, Xiang-Dong ; Xie, Qianghua ; Hooker, Joe ; Lu, Shifeng ; Lee, J.J. ; Tobin, Phil ; Liu, Wei ; Cross, Linda

Pub. info.:	Novel materials and processes for advances CMOS : symposium held December 2-4, 2002, Boston, Massachusetts, U.S.A.. pp.93-98, 2003. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	745