1.

Conference Proceedings
Conference Proceedings
1. Can Landsat imagery provide hi-resolution mapping of sea surface temperature in a small embayment after a convective cooling event?
Wang, X. H. ; Paull, D. J.
Pub. info.: Ocean remote sensing and applications : 24-26 October 2002, Hangzhou, China.  pp.426-433,  2003.  Bellingham, Wash.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4892
2.

Conference Proceedings
Conference Proceedings
2. Analysis of deactivation of a water gas shift catalyst CoMoK/Al2O3 in an ammonia plant
Li, W. D. ; Chen, M. J. ; Wang, X. H. ; Lu, X. W. ; Li, Y. H. ; Cheng, J. S. ; Kong, Y. H.
Pub. info.: Catalyst deactivation 1994 : proceedings of the 6th international symposium, Ostend (Belgium), October 3-5, 1994.  pp.617-,  1994.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 88
3.

Conference Proceedings
Conference Proceedings
3. On the Methodology of Numerical Etching
Wang, X. H. ; Shyu, K. ; Chang, C-T. ; Zheng, D. W. ; Wen, W.
Pub. info.: Materials reliability in microelectronics IX : symposium held April 6-8, 1999, San Francisco, California, U.S.A..  pp.243-,  1999.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 563
4.

Conference Proceedings
Conference Proceedings
4. The development of a long-pulse excimer laser system
Losev, V. F. ; Kovalchuk, B. M. ; Tarasenko, V. F. ; Panchenko, Yu. N. ; Ivanov, N. G. ; Zorin, V. B. ; Skakun, V. S. ; Konovalov, I. N. ; Panchenko, A. N. ; Abdullin, E. N. ; Tolkachev, V. S. ; Liu, J. R. ; Yi, A. P. ; Zhao, X. Q. ; Zhang, Y. S. ; Yu, L. ; Ma, L. Y. ; Huang, K. ; Tang, Y. ; Wang, X. H. ; Yuan, X. ; Ye, X. S. ; Wang, L. J.
Pub. info.: XV International Symposium on Gas Flow, Chemical Lasers, and High-Power Lasers.  pp.566-569,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5777