1.

Conference Proceedings
Conference Proceedings
1. Nitrogen and Hydrogen Induced Trap Passivation at the SiO2/4H-SiC Interface
Dhar, S. ; Wang, S.R. ; Ahyi, A.C. ; Isaacs-Smith, T. ; Pantelides, S.T. ; Williams, J.R. ; Feldman, L.C.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.949-954,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
2.

Conference Proceedings
Conference Proceedings
2. Gamma Irradiation Effects on 4H-SiC MOS Capacitors and MOSFETs
Ahyi, A.C. ; Wang, S.R. ; Williams, J.R.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.1063-1066,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
3.

Conference Proceedings
Conference Proceedings
3. Diffusion Studies Of Cu In Si And Low-K Dielectric Materials
Prasad, K. ; Yuan, X.L. ; Tan, C.M. ; Zhang, D.H. ; Li, C. Y. ; Wang, S.R. ; Yuan, S.Y.J. ; Xie, J.L. ; Gui, D. ; Foo, P.D.
Pub. info.: Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.395-400,  2002.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 716
4.

Conference Proceedings
Conference Proceedings
4. New Applications of MetaPULSE in Copper Metallization Process
Liu, H. ; Wang, S.R. ; He, L. ; Zhang, Y. ; Li, W.H. ; Wu, J.J. ; Qian, Y. ; Li, C.Y. ; Koh, L.T. ; Liu, Y.J. ; Xie, J.
Pub. info.: Semiconductor technology (ISTC 2001) : proceedings of the 1st International Conference on Semiconductor Technology.  pp.66-77,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-17
5.

Conference Proceedings
Conference Proceedings
5. OBIC Measurements of 1.3kV 6H-SiC Bipolar Diodes Protected by Junction Termination Extension
Wang, S.R. ; Raynaud, C. ; Planson, D. ; Lazar, M. ; Chante, J.P.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.863-866,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436