1.

Conference Proceedings
Conference Proceedings
1. Dynamic Jahn-Teller Effect in C60
Wang, W. ; Wang, C.L. ; Bishop, A. ; Yu, L. ; Su, Z. ; Gammel, J.
Pub. info.: Proceedings of the symposium on recent advances in the chemistry and physics of fullerenes and related materials.  pp.1224-1231,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-10
2.

Conference Proceedings
Conference Proceedings
2. Polypyrrole actuators as valves for controlled drug delivery
Wang, C. ; Xu, H. ; Wang, C.L. ; Zoval, J. ; Madou, M.
Pub. info.: Smart structures and materials 2004 : electroactive polymer actuators and devices (EAPAD) : 15-18 March 2004, San Diego, California, USA.  pp.468-474,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5385
3.

Conference Proceedings
Conference Proceedings
3. lssues on the In-Situ Cleaning of the Silicon Surface and the Process Conditions for Epitaxial Silicon Growth in an RTP CVD Systems
Wang, C.L. ; Unnikrishnan, S. ; Kim, B.Y. ; Kwong, D.L. ; Tasch, A.F.
Pub. info.: Proceedings of the Thirteenth International Symposium on Chemical Vapor Deposition.  pp.306-311,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-5
4.

Conference Proceedings
Conference Proceedings
4. Effect of Trace Oxygen on Selective Silicon Deposition in a Single-Wafer RTP CVD Reactor
Wang, C.L. ; Unnikrishnan, S. ; Kim, B.Y. ; Kwong, D.L. ; Tasch, A.F.
Pub. info.: Proceedings of the Thirteenth International Symposium on Chemical Vapor Deposition.  pp.312-317,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-5
5.

Conference Proceedings
Conference Proceedings
5. Gaussian optical analysis for a ‘3+2’ -model zoom lens
Wang, C.L. ; Li, X.N. ; He, L.Q.
Pub. info.: Optical design and testing : 15-18 October 2002, Shanghai, China.  pp.652-655,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4927
6.

Conference Proceedings
Conference Proceedings
6. Electric Field Dependent Positronium Formation in α-SiO2
Kobayashi, Y. ; Wang, C.L. ; Hirata, K. ; Kouchi, N.
Pub. info.: Positron annihilation, ICPA-12 : Proceedings of the 12th International Conference on Positron Annihilation, August 6-12, 2000, München, Germany.  pp.138-140,  2001.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 363-365
7.

Conference Proceedings
Conference Proceedings
7. Detection of environment pollution by measuring cholroplast delayed light emission
Wang, C.L. ; Xing, D. ; Wang, J.
Pub. info.: Advanced sensor systems and applications : 15-18 October 2002, SHanghai, China.  pp.223-229,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4920
8.

Conference Proceedings
Conference Proceedings
8. Power allocation for varifocal lens of two groups
Wang, C.L. ; Li, X.N. ; He, L.Q.
Pub. info.: Optical design and testing : 15-18 October 2002, Shanghai, China.  pp.656-659,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4927
9.

Conference Proceedings
Conference Proceedings
9. Electric Field Effect on Ps Formation. Black Blob Model
Stepanov, S.V. ; Byakov, V.M. ; Wang, C.L. ; Kobayashi, Y. ; Hirata, K.
Pub. info.: Positron annihilation, ICPA-12 : Proceedings of the 12th International Conference on Positron Annihilation, August 6-12, 2000, München, Germany.  pp.392-394,  2001.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 363-365
10.

Conference Proceedings
Conference Proceedings
10. Ultrathin Oxide Reliability: Effects of Gate Doping Concentration and Poly-Si/SiO2 Interface Stress Relaxation
Unnikrishnan, S. ; Kim, B.Y. ; Wang, C.L. ; Kwong, D.L. ; Tasch, A.F.
Pub. info.: The physics and chemistry of SiO[2] and the Si-SiO[2] interface-3, 1996 : proceedings of the Third International Symposium on the Physics and Chemistry of SiO[2] and the Si-SiO[2] Interface.  pp.744-752,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-1