Kuo L. ; Bock J. J ; Chattopadthyay G. ; Goldin A. ; Golwala S. ; Holmes W. ; Irwin K. ; Kenyon M. ; Lange A. E ; LeDuc H. G ; Rossinot P. ; Vayonakis A. ; Wang G. ; Yun M
Pub. info.:
Millimeter and submillimeter detectors and instrumentation for astronomy III : 29-31 May, 2006, Orlando, Florida, USA. pp.62751M-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
ICO20: illumination, radiation, and color technologies : 21-26 August 2005, Changchun, China. pp.60330R-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
ICMIT 2005: mechatronics, MEMS, and smart materials : 20-23 September 2005, Changchun, China. pp.604008-604008, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Remote sensing and space technology for multidisciplinary research and applications : 19-24 May 2005, Beijing, China. pp.61990F-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Remote sensing and space technology for multidisciplinary research and applications : 19-24 May 2005, Beijing, China. pp.619905-619906, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
MIPPR 2005 : Geospatial information, data mining, and applications : 31 October-2 November 2005, Wuhan, China. pp.604529-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
ICO20: illumination, radiation, and color technologies : 21-26 August 2005, Changchun, China. pp.603302-603302, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering