1.

Conference Proceedings
Conference Proceedings
1. Properties of Silicon Point Defects as Revealed by Lithium Ion Drifting
Knowlton, W.B. ; Walton, J.T. ; Lee, J.S. ; Lewak, D. ; Wong, Y.K. ; Haller, E.E.
Pub. info.: Proceedings of the Fourth International Symposium on Process Physics and Modeling in Semiconductor Technology.  pp.324-336,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-4
2.

Conference Proceedings
Conference Proceedings
2. Lithium-Ion Drifting: Application to the Study of Point Defects in Floating-Zone Silicon
Walton, J.T. ; Haller, B.E. ; Knowlton, W.B. ; Wong, Y.K. ; Ammon, W.V. ; Zuichner, W.
Pub. info.: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.400-411,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-12
3.

Conference Proceedings
Conference Proceedings
3. Past, Present and Future Cosmic Ray Identification Applications for Large Area Silicon Detectors
Walton, J.T. ; Lee, J.S. ; Lewak, D. ; Wong, Y.K. ; Cummings, A.C. ; Mewaidt, R.A. ; Wiedenbeck, M.E. ; Knowlton, W.B. ; Haller, E.E.
Pub. info.: Proceedings of the Fourth International Symposium on High Purity Silicon.  pp.407-421,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-13
4.

Conference Proceedings
Conference Proceedings
4. Inclusion of an ultraviolet radiation transfer component in an urban forest effects model for predicting tree influences on potential below-canopy exposure to UVB radiation
Heisler, G.M. ; Grant, R.H. ; Nowak, D.J. ; Gao, W. ; Crane, D.E. ; Walton, J.T.
Pub. info.: Ultraviolet ground- and space-based measurements, models, and effects III : 4-6 August 2003, San Diego, California, USA.  pp.228-235,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5156