1.

Conference Proceedings

Conference Proceedings
Walton, D. T. ; Frost, H. J. ; Thompson, C. V.
Pub. info.: Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A..  pp.219-224,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 225
2.

Conference Proceedings

Conference Proceedings
Frost, H. J. ; Hayashi, Y. ; Thompson, C. V. ; Walton, D. T.
Pub. info.: Mechanisms of thin film evolution.  pp.485-,  1994.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 317
3.

Conference Proceedings

Conference Proceedings
Frost, H. J. ; Hayashi, Y. ; Thompson, C. V. ; Walton, D. T.
Pub. info.: Mechanisms of thin film evolution.  pp.431-,  1994.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 317
4.

Conference Proceedings

Conference Proceedings
Li, M. -J. ; Nolan, D. A. ; Berkey, G. E. ; Chen, X. ; Koh, J. ; Walton, D. T. ; Wang, J. ; Wood, W. A. ; Zenteno, L. A.
Pub. info.: Passive Components and Fiber-based Devices.  pp.612-621,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5623