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Conference Proceedings
Walton, D. T. ; Frost, H. J. ; Thompson, C. V.
Pub. info.:
Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. . pp.219-224, 1991. Pittsburgh, Pa.. Materials Research Society
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
225
2.
Conference Proceedings
Frost, H. J. ; Hayashi, Y. ; Thompson, C. V. ; Walton, D. T.
Pub. info.:
Mechanisms of thin film evolution . pp.485-, 1994. Pittsburgh, PA. MRS - Materials Research Society
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
317
3.
Conference Proceedings
Frost, H. J. ; Hayashi, Y. ; Thompson, C. V. ; Walton, D. T.
Pub. info.:
Mechanisms of thin film evolution . pp.431-, 1994. Pittsburgh, PA. MRS - Materials Research Society
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
317
4.
Conference Proceedings
Li, M. -J. ; Nolan, D. A. ; Berkey, G. E. ; Chen, X. ; Koh, J. ; Walton, D. T. ; Wang, J. ; Wood, W. A. ; Zenteno, L. A.
Pub. info.:
Passive Components and Fiber-based Devices . pp.612-621, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5623