1.

Conference Proceedings

Conference Proceedings
Nussmeier,M. ; Walker,D. ; Frank,J.D. ; Lane,R. ; Chatterton,T.
Pub. info.: Thermosense XXIII : 16-19 April 2001, Orlando, USA.  4360  pp.37-47,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4360
2.

Conference Proceedings

Conference Proceedings
Saxler,A. ; Walker,D. ; Zhang,X. ; Kung,P. ; Xu,J. ; Razeghi,M.
Pub. info.: Photodetectors : materials and devices : 1-2 February 1996.  pp.132-139,  1996.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2685
3.

Conference Proceedings

Conference Proceedings
Saxler,A. ; Kim,K.S. ; Walker,D. ; Kung,P. ; Zhang,X. ; Brown,G.J. ; Mitchel,W.C. ; Razeghi,M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1229-1234,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
4.

Conference Proceedings

Conference Proceedings
Saxler,A. ; Kung,P. ; Zhang,X. ; Walker,D. ; Solomon,J. ; Mitchel,W.C. ; Razeghi,M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1081-1086,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
5.

Conference Proceedings

Conference Proceedings
Saxier,A. ; Kung,P. ; Zhang,X. ; Walker,D. ; Soiomon,J. ; Ahoujja,M. ; Mitchel,W.C. ; Vydyanath,H.R. ; Razeghi,M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1161-1166,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
6.

Conference Proceedings

Conference Proceedings
Kung,P. ; Saxler,A. ; Zhang,X. ; Walker,D. ; Razeghi,M. ; Ulmer,M.P.
Pub. info.: Photodetectors : materials and devices : 1-2 February 1996.  pp.126-131,  1996.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2685
7.

Conference Proceedings

Conference Proceedings
Sandvik,P.M. ; Walker,D. ; Kung,P. ; Mi,K. ; Shahedipour,F. ; Kumar,V. ; Zhang,X. ; Diaz,J. ; Jelen,C.L. ; Razeghi,M.
Pub. info.: Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California.  pp.265-272,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3948
8.

Conference Proceedings

Conference Proceedings
Razeghi,M. ; Kung,P. ; Walker,D. ; Hamilton,M. ; Diaz,J.
Pub. info.: Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland.  pp.14-20,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3725
9.

Conference Proceedings

Conference Proceedings
Walker,D. ; Zhang,X. ; Saxler,A. ; Kung,P. ; Xu,J. ; Razeghi,M.
Pub. info.: Photodetectors : materials and devices II : 12-14 February 1997, San Jose, California.  pp.267-274,  1997.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2999
10.

Conference Proceedings

Conference Proceedings
Kung,P. ; Walker,D. ; Sandvik,P. ; Hamilton,M. ; Diaz,J. ; Lee,I.-H. ; Razeghi,M.
Pub. info.: Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California.  pp.223-229,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3629