1.

Conference Proceedings

Conference Proceedings
Koidl,P. ; Wild,Ch. ; Dischler,B. ; Wagner,J. ; Ramsteiner,M.
Pub. info.: Properties and characterization of amorphous carbon films.  pp.41-70,  1990.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 52-53
2.

Conference Proceedings

Conference Proceedings
Roos,G. ; Schbner,A. ; Pensl,G. ; Krambrock,K. ; Meyer,B.K. ; Spaeth,J.-M. ; Wagner,J.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.951-956,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
3.

Conference Proceedings

Conference Proceedings
Davidson,B.R. ; Newman,R.C. ; Pritchard,R.E. ; Robbie,D.A. ; Sangster,M.J.L. ; Wagner,J. ; Fischer,A. ; Ploog,K.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.247-252,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
4.

Conference Proceedings

Conference Proceedings
Wagner,J. ; Ramsteiner,M. ; Ashwin,M.J. ; Fahy,M.R. ; Newman,R.C. ; Braun,W. ; Ploog,K.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.259-264,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
5.

Conference Proceedings

Conference Proceedings
Alvarez,A.L. ; Wagner,J. ; Calle,F. ; Maier,M. ; Gutierrez,G. ; Sacedon,A. ; Calleja,E. ; Mufioz,E.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.241-246,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
6.

Conference Proceedings

Conference Proceedings
Newman,R.C. ; Davidson,B.R. ; Addinall,R. ; Murray,R. ; Emmert,J.W. ; Wagner,J. ; Gotz,W. ; Roos,G. ; Pensl,G.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.229-234,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
7.

Conference Proceedings

Conference Proceedings
Miler,M. ; Aubrecht,I. ; Koudela,I. ; Wagner,J.
Pub. info.: OPTIKA '98, 14-17 September 1998, Budapest, Hungary.  pp.461-464,  1998.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3573
8.

Conference Proceedings

Conference Proceedings
Bouchal,Z. ; Horak,R. ; Wagner,J. ; Perina,J. ; Bajer,J.
Pub. info.: Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea.  Part1  pp.345-346,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2778
9.

Conference Proceedings

Conference Proceedings
Wagner,J. ; Ramsteiner,M. ; Murray,R. ; Newman,R.C.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.815-820,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
10.

Conference Proceedings

Conference Proceedings
McMillen,D.K. ; Hudson,T.D. ; Wagner,J. ; Singleton,J.S. ; Banerjee,P.P. ; Danileiko,A.Y. ; Yin,S. ; Wang,Y. ; Yu,F.T.S. ; Darwish,A.M. ; Aggarwal,M.D. ; He,K.X. ; Wang,J.C.
Pub. info.: Photorefractive fiber and crystal devices : materials, optical properties, and applications III : 28-29 July, 1997, San Diego, California.  pp.39-49,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3137