Advanced biomedical and clinical diagnostic systems II : 25-26 January 2004, San Jose, California, USA. pp.39-49, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
van Dal, M.J.H. ; Lauwers, A. ; Cunniffe, J. ; Verbeeck, R. ; Vrancken, C. ; Demeurisse, C. ; Dao, T. ; Tamminga, Y. ; Veloso, A. ; Kittl, J.A. ; Maex, K.
Pub. info.:
Advanced gate stack, source/drain and channel engineering for Si-based CMOS, new materials, processes, and equipment : proceedings of the international symposium. pp.233-240, 2005. Pennington, NJ. Electrochemical Society
Kittl, J. A. ; Lauwers, A. ; Pawlak, M. A. ; Demeurisse, C. ; Anil, K. G. ; Veloso, A. ; van Dal, M. J. H. ; Schram, T. ; Brijs, B. ; Kaiser, M. ; Kubicek, S. ; Cunniffe, J. ; Verbeeck, R. ; Vrancken, C. ; Biesemans, S. ; Maex, K.
Pub. info.:
Advanced gate stack, source/drain and channel engineering for Si-based CMOS, new materials, processes, and equipment : proceedings of the international symposium. pp.225-232, 2005. Pennington, NJ. Electrochemical Society
Chamirian, O. ; de Potter, M ; Lauwers, A. ; Richard, O. ; Lindsay, R. ; Vrancken, C. ; Moex, K.
Pub. info.:
Advanced short-time thermal processing for Si-based CMOS devices : proceedings of the international symposium. pp.155-160, 2003. Pennington, NJ. Electrochemical Society
Lovhoiden, G. ; Deshmukh, H. ; Vrancken, C. ; Zhang, Y. ; Zeman, H.D. ; Weinberg, D.
Pub. info.:
Advanced biomedical and clinical diagnostic systems : 26-28 January 2003, San Jose, California, USA. pp.189-200, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering