1.

Conference Proceedings
Conference Proceedings
1. Laser-based technology of scanning near-field optical probe fabrication: study of kinetics and progress of measuring
Veiko, V.P. ; Kalachev, A.N. ; Kaporsky, L.N. ; Volkov, S.A. ; Voznesensky, N.B.
Pub. info.: Third International Symposium on Laser Precision Microfabrication : proceedings : 27-31 May, 2002, Osaka, Japan.  pp.162-172,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4830
2.

Conference Proceedings
Conference Proceedings
2. Principles of highest-precision optical parts estimation on the basis of a point-diffraction interferometer
Voznesensky, N.B. ; Lee, K.-H. ; Kirillovsky, V.K.
Pub. info.: Optical fabrication, testing, and metrology : 30 September-3 October 2003, St. Etienne, France.  pp.241-251,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5252
3.

Conference Proceedings
Conference Proceedings
3. Optical interconnection optimization based on a classical approach (Invited Paper)
Veiko, V.P. ; Voznesensky, N.B. ; Petrov, A. ; Pashin, V.F. ; Voznesenskaya, N.N. ; Metev, S.M. ; Wochnowski, C.
Pub. info.: Photon Processing in Microelectronics and Photonics II.  pp.569-577,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4977
4.

Conference Proceedings
Conference Proceedings
4. Laser technology of SNOM-tips fabrication: process diagnostics, processing, and testing
Veiko, V.P. ; Kalachev, A.N. ; Kaporsky, L.N. ; Volkov, S.A. ; Voznesensky, N.B.
Pub. info.: Laser Processing of Advanced Materials and Laser Microtechnologies.  pp.164-174,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5121
5.

Conference Proceedings
Conference Proceedings
5. Concept of far-field optical evaluation of the apparatus function of an SNOM tip
Voznesensky, N.B. ; Veiko, V.P. ; Ivanova, T.V. ; Lee, K.-H.
Pub. info.: Laser-Assisted Micro- and Nanotechnologies 2003.  pp.50-62,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5399
6.

Conference Proceedings
Conference Proceedings
6. Interferometers with diffraction on dot aperture for testing of shape errors of precise surfaces
Kirillovsky, V.K. ; Voznesensky, N.B. ; Troukhine, M.M. ; Lee, K.-H.
Pub. info.: Laser-Assisted Micro- and Nanotechnologies 2003.  pp.77-87,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5399