Blank Cover Image

Ion Beam Induced Epitaxial Crystallization of Buried SiC Layers in Silicon

Author(s):
Publication title:
Materials science applications of ion beam techniques : proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, incoeporating the 1st German-Australian Workshop on Ion Beam Analysis, Seeheim, Germany, September 9-12 1996
Title of ser.:
Materials science forum
Ser. no.:
248-249
Pub. Year:
1997
Page(from):
73
Page(to):
78
Pub. info.:
Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497676 [0878497676]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

Volz,K., Lindner,J.K.N., Stritzker,B.

Trans Tech Publications

Lindner, J. K. N., Volz, K., Stritzker, B.

MRS - Materials Research Society

Lindner,J.K.N., Reiber,W., Stritzker,B.

Trans Tech Publications

Lindner, J. K. N., Volz, K., Stritzker, B.

MRS - Materials Research Society

Lindner, J. K. N., Gotz, B., Frohnwieser, A., Stritzker, B.

MRS - Materials Research Society

Lindner,J.K.N.

Trans Tech Publications

Lindner, J. K. N., Frohnwieser, A., Rauschenbach, B., Stritzker, B.

MRS - Materials Research Society

Lindner, J. K. N., Eder, J., Stritzker, B.

MRS - Materials Research Society

Thoma, S., Lindner, J. K. N., Stritzker, B.

MRS - Materials Research Society

Tsang, W.M., Wong, S.P., Lindner, J.K.N.

Materials Research Society

Lindner, Jorg K.N., Wenzel, Stephanie, Stritzker, Bernd

Materials Research Society

Tsang W. M, Wong S. P, Lindner J. K. N

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12