1.
Conference Proceedings
Ronse,K. ; Vandenberghe,G. ; Jaenen,P. ; Delvaux,C. ; Vangoidsenhoven,D. ; Roey,F.Van ; Pollers,I. ; Maenhoudt,M. ; Goethals,A.M. ; Pollentier,I.K. ; Vleeming,B. ; Schenau,K.van lngen ; Heskamp,B. ; Davies,G. ; Niroomand,A.
Pub. info.:
Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA . Part1 pp.410-422, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4000
2.
Conference Proceedings
Vleeming,B. ; Heskamp,B. ; Bakker,H. ; Verstappen,L. ; Finders,J. ; Stoeten,J. ; Borret,R. ; Roempp,O.
Pub. info.:
Optical Microlithography XIV . 4346 pp.634-650, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4346
3.
Conference Proceedings
Vandenberghe,G.N. ; Kim,Y.-C. ; Delvaux,C. ; Lucas,K.D. ; Choi,S.-J. ; Ercken,M. ; Ronse,K. ; Vleeming,B.
Pub. info.:
Optical Microlithography XIV . 4346 pp.179-190, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4346
4.
Conference Proceedings
Schenau,K.van Ingen ; Vleeming,B. ; Ansem,W.F.Gehoel-van ; Wong,P. ; Vandenberghe,G.N.
Pub. info.:
Advances in Resist Technology and Processing XVIII . 4345 pp.200-210, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4345