1.

Conference Proceedings
Conference Proceedings
1. Narrow resonance profiling study of the oxidation of Ti1-xAlN barrier layer
Hugon, M. C. ; Desvignes, J. M. ; Letendu, F. ; Agius, B. ; Vickridge, I. ; Kim, D. J. ; Ayguavives, F. ; Kingon, A. I.
Pub. info.: Ferroelectric thin films VIII : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A..  pp.97-,  2000.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 596
2.

Conference Proceedings
Conference Proceedings
2. Tm-Er codoping Al2O3 Thin Films: Activation by Annealing
Xiao, Zhisong ; Serna, R. ; Afonso, C.N. ; Vickridge, I.
Pub. info.: Rare-earth doping for optoelectronic applications : symposium held March 29-31, 2005, San Francisco, California, U.S.A..  pp.157-162,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 866
3.

Conference Proceedings
Conference Proceedings
3. Study of Poly-Si/TaSiN/Pt Structure for Stacked Capacitors
Letendu, F. ; Hugon, M. C. ; Voldoire, O. ; Agius, B. ; Vickridge, I. ; Berthier, C. ; Lameille, J. M.
Pub. info.: Ferroelectric thin films XI : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.13-18,  2003.  Warrendale, Pa.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 748
4.

Conference Proceedings
Conference Proceedings
4. Oxidation Resistance Of TaSiN Diffusion Barriers For Stacked Capacitors
Letendu, F. ; Hugon, M.C. ; Agius, B. ; Vickridge, I. ; Ayguavives, F. ; Kingon, A.I.
Pub. info.: Ferroelectric thin films IX : symposium held November 26-30, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 655
5.

Conference Proceedings
Conference Proceedings
5. Modification of the Oxide/Semiconductor Interface by High Temperature NO Treatments: A Combined EPR, NRA and XPS Study on Oxidized Porous and Bulk n-Type 4H-SiC
Bardeleben, H. J. von ; Cantin, J. L. ; Vickridge, I. ; Song, Y. ; Dhar, S. ; Feldman, L. C. ; Williams, J. R. ; Ke, L. ; Shishkin, Y. ; Devaty, R. P. ; Choyke, W. J.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.277-282,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
6.

Conference Proceedings
Conference Proceedings
6. Characterization of SiC Thin Film Obtained by Magnetron Reactive Sputtering: IBA, IR and Raman Studies
Colder, H. ; Morales, M. ; Rizk, R. ; Vickridge, I.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.287-290,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
7.

Conference Proceedings
Conference Proceedings
7. Tm-Er Codoping A12O3 Thin Films: Activation by Annealing
Xiao, Zhisong ; Serna, R. ; Afonso, C. N. ; Vickridge, I.
Pub. info.: Advanced devices and materials for laser remote sensing : symposium held March 29-31, 2005, San Francisco, California, U.S.A..  pp.175-180,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 883
8.

Conference Proceedings
Conference Proceedings
8. Effect of Annealing Treatment on PZT Thin Film Properties Using Oxygen 18 Depth Profiling Technique
Ayguavives, F. ; Ea-Kim, B. ; Agius, B. ; Vickridge, I. ; Kingon, A. I.
Pub. info.: Ferroelectric thin films VII : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A..  pp.393-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 541
9.

Conference Proceedings
Conference Proceedings
9. Damage Distributions Induced by Channeling Implantation of Nitrogen into 6H Silicon Carbide
Zolnai, Z. ; Khanh, N.Q. ; Lohner, T. ; Ster, A. ; Kotai, E. ; Vickridge, I. ; Gyulai, J.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.645-648,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436