1.

Conference Proceedings

Conference Proceedings
Li, H. ; Peng, H. ; Li, X. ; Veroustraete, F.
Pub. info.: Remote sensing for environmental monitoring, GIS applications, and geology V : 19-20 September 2005, Bruges, Belgium.  pp.59831W-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5983
2.

Conference Proceedings

Conference Proceedings
Li, H. ; Peng, H. ; Li, X. ; Veroustraete, F. ; Chen, Y.
Pub. info.: Remote sensing for environmental monitoring, GIS applications, and geology V : 19-20 September 2005, Bruges, Belgium.  pp.59831V-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5983
3.

Conference Proceedings

Conference Proceedings
Ma, M. ; Veroustraete, F. ; Wang, P. ; Wang, X.
Pub. info.: Remote sensing for environmental monitoring, GIS applications, and geology IV : 14-16 September 2004, Maspalomas, Gran Canaria, Spain.  pp.384-394,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5574
4.

Conference Proceedings

Conference Proceedings
Ma, M. ; Wang, X. ; Veroustraete, F. ; Dong, Q.
Pub. info.: Applications with weather satellites :24 October 2002, Hangzhou, China.  pp.10-17,  2003.  Bellingham, Wash.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4895
5.

Conference Proceedings

Conference Proceedings
Lu, L. ; Li, X. ; Dong, Q. ; Swinnen, E. ; Veroustraete, F.
Pub. info.: Ecosystems Dynamics, Ecosystem-Society Interactions, and Remote Sensing Applications for Semi-Arid and Arid Land.  Part Two  pp.863-870,  2003.  Bellingham, Wash.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4890