Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA. pp.157-165, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Velicu, S. ; Lee, T. S. ; Ashokan, R. ; Grein, C. H. ; Boieriu, P. ; Chen, Y. P. ; Dinan, J. H. ; Lianos, D.
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Materials for infrared detectors III : 7-8 August 2003, San Diego, California, USA. pp.14-32, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering