1.

Conference Proceedings
Conference Proceedings
1. Impedance imaging and Markov chain Monte Carlo methods
Somersalo,E. ; Kaipio,J.P. ; Vauhkonen,M.J. ; Baroudi,D. ; Jarvenpaae,S.
Pub. info.: Computational, experimental, and numerical methods for solving ill-posed inverse imaging problems : medical and nonmedical applications : 30-31 July 1997, San Diego, California.  pp.175-185,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3171
2.

Conference Proceedings
Conference Proceedings
2. Three-dimensional electrical impedance tomography using complete electrode model
Vauhkonen,M.J. ; Vauhkonen,P.J. ; Kaipio,J.P. ; Karjalainen,P.A.
Pub. info.: Computational, experimental, and numerical methods for solving ill-posed inverse imaging problems : medical and nonmedical applications : 30-31 July 1997, San Diego, California.  pp.166-174,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3171
3.

Conference Proceedings
Conference Proceedings
3. Recursive estimation of fast impedance changes in electrical impedance tomography and a related problem
Kaipio,J.P. ; Somersalo,E. ; Karjalainen,P.A. ; Vauhkonen,M.J.
Pub. info.: Computational, experimental, and numerical methods for solving ill-posed inverse imaging problems : medical and nonmedical applications : 30-31 July 1997, San Diego, California.  pp.208-216,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3171
4.

Conference Proceedings
Conference Proceedings
4. Effects of inaccuracies in fluid dynamical models in state estimation of process tomography
Seppanen,A. ; Vauhkonen,M.J. ; Somersalo,E. ; Kaipio,J.P.
Pub. info.: Process imaging for automatic control : 5-6 November 2000, Boston, USA.  pp.69-80,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4188