1.

Conference Proceedings
Conference Proceedings
1. High Field Stressing Effects in JVD Nitride Capacitors
ManjulaRani, K.N. ; Ramgopal Rao, V. ; Vasi, J.
Pub. info.: Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001).  VOL-2  pp.1316-1319,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4746
2.

Conference Proceedings
Conference Proceedings
2. Characterization and Simulation of Lateral Asymmetric Channel Silicon-on-Insulator MOSFETs
Najeeb-ud-Din ; Ramgopal Rao, V. ; Vasi, J.
Pub. info.: Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001).  VOL-1  pp.644-648,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4746
3.

Conference Proceedings
Conference Proceedings
3. Suppression Of Parasitic BJT Action In Single Pocket Thin Film Deep Sub-Micron Soi Mosfets
Din, Najeeb-ud ; Kumar, Aatish ; Dunga, Mohan V. ; Rao, V. Ramgopal ; Vasi, J.
Pub. info.: Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.3-8,  2002.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 716
4.

Conference Proceedings
Conference Proceedings
4. Degradation Study Of Ultra-Thin JVD Silicon Nitride MNSFETs
ManjulaRani, K.N. ; Rao, V. Ramgopal ; Vasi, J.
Pub. info.: Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.209-214,  2002.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 716