1.

Conference Proceedings
Conference Proceedings
1. *QUANTITATIVE X-RAY STRUCTURE DETERMINATION OF SUPERLATTICES AND INTERFACES
Schuller, Ivan K. ; Fullerton, Eric E. ; Vanderstraeten, H. ; Bruynseraede, Y.
Pub. info.: Structure/property relationships for metal/metal interfaces : symposium held April 29-May 1, 1991, Anaheim, California, U.S.A..  pp.41-52,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 229
2.

Conference Proceedings
Conference Proceedings
2. ON THE OHMIC CONTACT FORMATION MECHANISM IN THE Au/Te/n-GaAS SYSTEM
Wuyts, K. ; Langouche, G. ; Vanderstraeten, H. ; Silverans, R. E. ; Van Hove, M. ; Van Rossum, M. ; Munder, H. ; Luth, H.
Pub. info.: Advanced metallizations in microelectronics : symposium held April 16-20, 1990, San Francisco, California, U.S.A..  pp.345-350,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 181
3.

Conference Proceedings
Conference Proceedings
3. CRYSTALLIZATION AND MELTING IN MULTILAYERED STRUCTURES
Sevenhans, w. ; Vanderstraeten, H. ; Locquet, J. P. ; Bruynseraede, Y. ; Homma, H. ; Schuller, Ivan K.
Pub. info.: Multilayers : synthesis, properties, and non-electronic applications : symposium held December 2-4, 1987, Boston, Massachusetts, U.S.A..  pp.217-222,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 103