Blank Cover Image

PRECIPITATE MORPHOLOGIES IN OXYGEN-ION IMPLANTED SILICON:A HIGH RESOLUTION ELECTRON MICROSCOPY STUDY.

Author(s):
Publication title:
Defects in Semiconductors : Proceedings of the 14th International Conference on Defects in Semiconductors, ICDS-14, Paris, France, August 18-22, 1986
Title of ser.:
Materials science forum
Ser. no.:
10-12
Pub. Year:
1986
Vol.:
Part3
Page(from):
1153
Page(to):
1158
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878495511 [0878495517]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

Carpenter, R.W., Vangerschaeve G., Vanker, C. J., Wilson, S.R.

Materials Research Society

Krause, S. J., Jung, C. O., Ravi, T. S., Wilson, S. R., Burke, D. E.

Materials Research Society

Carpenter, R. W., Chan, I, Tsi, H. I, Varker, C., Demer, L. J.

North-Holland

Visitserngtrakul, S., Jung, C. O., Cordts, B. F., Roitman, P., Krause, S. J.

Materials Research Society

Liliental-Weber, Z., Carpenter, R.W., Kelly, J.C.

Materials Research Society

Gibson, J.M., McDonald, M.L., Unterwald, F.C., Gossmann, H.-J., Bean, J.C., Tung, R.T.

Materials Research Society

Carpenter, R. W., Kim, M. J.

Materials Research Society

McKernan, Stuart, Barry Carter, C.

Materials Research Society

Chan, S.S., Varker, C. J., Whitfield, J., Carpenter, R. W.

Materials Research Society

Kiely, C.J., Chyi, J-I., Rokett, Chyi A,, Morkoc, H.

Materials Research Society

Bhatti, A.R., Barry, J.C., Cantor, B.

Materials Research Society

Kramer, M.J., McCallum, R.W.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12