The method for the determination of electrical self-capacitance of the atomic and molecular scale objects

The method for the determination of electrical self-capacitance of the atomic and molecular scale objects

Author(s):

V. V. Shorokhov ( Moscow State Univ., Russia )
E. S. Soldatov ( Moscow State Univ., Russia )
V. G. Elenskiy ( Moscow State Univ., Russia )

Publication title:

Micro- and nanoelectronics 2007 : 1-5 October 2007, Zvenigorod, Russia

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

7025

Pub. Year:

2008

Page(from):

70250N-1

Page(to):

70250N-8

Pages:

8

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819472380 [0819472387]

Language:

English

Call no.:

P63600/7025

Type:

Conference Proceedings

Details

TDL ID:	ZA00052656
Series ID:	PA00000029
Conf. info. (Name):	International Conference on Micro- and Nanoelectronics - ICMNE
Conf. info. (Number):	2007
Conf. info. (Venue):	Zvenigorod, Russia
Conf. info. (Date):	2007.10.01-2007.10.05
Note for article:	Micro- and nanoelectronics 2007, 1-5 October 2007, Zvenigorod, Russia - Session 4. Nanosctructures and Nanodevices, 70250N, 7025-22

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