1.

Conference Proceedings
Conference Proceedings
1. Direct Proof of Argon Atoms Incorporated Into High-Purity Silicon Single Crystals During Growth in Argon Gas Ambient
Ulyashin,A.G. ; Job,R. ; Fahrner,W.R. ; Mudryi,A.V. ; Patuk,A.I. ; Shakin,I.A.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.66-76,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
2.

Conference Proceedings
Conference Proceedings
2. Bulk and Surface Properties of Cz Silicon After Hydrogen Plasma Treatments
Job,R. ; Ulyashin,A.G. ; Fahrner,W.R. ; Markevich,V.P. ; Murin,L.I. ; Lindstrom,J.L. ; Raiko,V. ; Engemann,J.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.209-220,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
3.

Conference Proceedings
Conference Proceedings
3. Influence of fluorine on electrical properties and complex formation in GaAs
Ulyashin,A.G. ; Bumay,Yu.A. ; Malahovskaya,V.E. ; Shlo-pak,N.V.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.1009-1014,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87