1.

Conference Proceedings
Conference Proceedings
1. Investigation of ion-implanted boron in diamond
Bharuth-Ram,K. ; Ittennann,B. ; Metzner,H. ; Fullgrabe,M. ; Heemeier,M. ; Kroll,F. ; Mai,F. ; Matbach,K. ; Meier,P. ; Peters,D. ; Thiess,H. ; Ackermann,H. ; Selischop,J.P.F. ; Stockmann,H.-J. ; Uhrmacher,M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.763-768,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings
Conference Proceedings
2. Level Splitting of the Cd-Ground State in Silicon
Wolf,H. ; Deubler,S. ; Forkel,D. ; Meyer,F. ; Uhrmacher,M. ; Witthuhn,W.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part1  pp.463-468,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41