1.

Conference Proceedings
Conference Proceedings
1. Gettering of Cu in silicon by silicon nitride precipitates
Popov, V.P. ; Tyschenko, I.E. ; Kachurin, G.A. ; Janovskaja, S.G. ; Obodnikov, V.I.
Pub. info.: Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II.  pp.309-317,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-22
2.

Conference Proceedings
Conference Proceedings
2. Defects and their electronic properties in high-pressure-annealed SOI structures sliced by hydrogen
Popov, V.P. ; Gutakovskii, A.K. ; Safronov, L.N. ; Tyschenko, I.E. ; Zhuravlev, S.K. ; Talochkin, A.B. ; Antonova, A.I. ; Naumova, O.V. ; Obodikov, V.I. ; Misiuk, A. ; Bak-Misiuk, J. ; Domagala, J. ; Romano-Rodrigues, A. ; Bachrouri, A.
Pub. info.: Progress in SOI structures and devices operating at extreme conditions.  pp.269-288,  2002.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 58
3.

Conference Proceedings
Conference Proceedings
3. Optically Active Silicon Nanostructures Prepared From Implanted Si by Annealing at High Hydrostatic Pressure
Misiuk, A. ; Tyschenko, I.E.
Pub. info.: Nanostructures : synthesis, functional properties and applications.  pp.619-638,  2003.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 128
4.

Conference Proceedings
Conference Proceedings
4. Raman and HRTEM investigations of Ge nanocrystals produced by Ge + -ion implantation of SiO2 films and subsequent high-pressure annealing
Tyschenko, I.E. ; Talochkin, A.B. ; Cherkov, A.G. ; Zhuravlev, K.S. ; Misiuk, A. ; Yankov, R.A. ; Skorupa, W.
Pub. info.: Solid State Crystals 2002: Crystalline Materials for Optoelectronics.  pp.236-242,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5136