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14 results

Conference Proceedings

1. Evaluation and discrimination method of mura in liquid crystal displays by just-noticeable-difference observation

Mori, Y. ; Yoshitake, R. ; Tamura, T. ; Yoshizawa, T. ; Tsuji, S.

Pub. info.:	Optomechatronic systems III : 12-14 November 2002, Stuttgart, Germany. pp.715-722, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4902

Conference Proceedings

2. Investigation of polarization effects on new mask materials

Itakura, Y. ; Kawasa, Y. ; Wakabayashi, O. ; Moriya, M. ; Nagai, S. ; Sumitani, A. ; Hagiwara, T. ; Ishimaru, T. ; Tsuji, S. ; Fujii, K. ; Wakamiya, W.

Pub. info.:	Optical microlithography XVIII : 1-4 March, 2005, San Jose, California, USA. pp.587-598, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5754

Conference Proceedings

3. Quantitative evaluation of luminance nonuniformity in liquid crystal displays based on sensory analysis

Mori, Y. ; Yoshitake, R. ; Tamura, T. ; Moriguchi, K. ; Tanahashi, K. ; Tsuji, S.

Pub. info.:	Algorithms and systems for optical information processing VI : 8-10 July, 2002, Seattle, Washington, USA. pp.283-290, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4789

Conference Proceedings

4. Characterization of Heterointerfaces in Thin-Film Transistors by Cross-Sectional Transmission Electron Microscopy

Kuroda, K. ; Tsuji, S. ; Hayashi, Y. ; Saka, H.

Pub. info.:	Atomic resolution microscopy of surfaces and interfaces : symposium held December 3-5, 1996, Boston, Massachusetts, U.S.A.. pp.67-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	466

Conference Proceedings

5. Characterization of Transparent Conductors in Indium Zinc Oxide and Their Application to Thin-Film Transistor Liquid-Crystal Displays

Takatsuji, H. ; Hiromori, T. ; Tsujimoto, K. ; Tsuji, S. ; Kuroda, K. ; Saka, H.

Pub. info.:	Flat-panel display materials--1998 : symposium held April 13-17, 1998, San Francisco, California, U.S.A.. pp.315-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	508

Conference Proceedings

6. Cross-Sectional TEM Sample Preparation Method Using FIB Etching for Thin-Film Transistor

Tsujimoto, K. ; Tsuji, S. ; Takatsuji, H. ; Kuroda, K. ; Saka, H. ; Miura, N.

Pub. info.:	Specimen preparation for transmission electron microscopy of materials IV : symposium held April 2, 1997, San Francisco, California, U.S.A.. pp.207-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	480

Conference Proceedings

7. Search for large-scale coincidences in network observation of extensive air showers

Ochi, N. ; Iyono, A. ; Kimura, H. ; Konishi, T. ; Nakatsuka, T. ; Ohara, S. ; Takahashi, N. ; Tsuji, S. ; Wada, T. ; Yamamoto, I. ; Yamashita, Y. ; Yanagimoto, Y.

Pub. info.:	Particle astrophysics instrumentation : 22-23 August 2002, Waikoloa, Hawaii, USA. pp.26-34, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4858

Conference Proceedings

8. The LAAS network observation for studying time correlations in extensive air showers

Ochi, N. ; Iyono, A. ; Kimura, H. ; Konishi, T. ; Nakamura, T. ; Nakatsuka, T. ; Ohara, S. ; Ohmori, N. ; Saito. K. ; Takahashi, N. ; Tsuji, S. ; Wada, T. ; Yamamoto, I. ; Yamashita, Y. ; Yanagimoto, Y.

Pub. info.:	Particle astrophysics instrumentation : 22-23 August 2002, Waikoloa, Hawaii, USA. pp.14-25, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4858

Conference Proceedings

9. Development and evaluation of an F2 laser for immersion interference lithography at 157 nm

Itakura, Y. ; Kawasa, Y. ; Wakabayashi, O. ; Moriya, M. ; Nagai, S. ; Sumitani, A. ; Hagiwara, T. ; Ishimaru, T. ; Tsuji, S. ; Fujii, K. ; Wakamiya, W.

Pub. info.:	Optical microlithography XVIII : 1-4 March, 2005, San Jose, California, USA. pp.1269-1278, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5754

10.

Conference Proceedings

10. Solid-Solutioning Effect of the Ni-Based Cermet on the Electrochemical Oxidation of Methane

Sato, K. ; Ohmine, Y. ; Ogasa, K. ; Tsuji, S.

Pub. info.:	Solid oxide fuel cells VIII (SOFC VIII) : proceedings of the international symposium. pp.695-703, 2003. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2003-7

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