Nanoengineering: fabrication, properties, optics, and devices : 4-6 August, 2004, Denver, Colorado. pp.142-149, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Nezhad, M.P. ; Tsai, C.-H. ; Pang, L. ; Nakagawa, W. ; Klemens, G. ; Fainman, Y.
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Nano- and micro-optics for information systems : 3-4 August 2003, San Diego, California, USA. pp.69-77, 2003. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Polarization measurement, analysis, and applications V : 8-9 July 2002, Seattle, USA. pp.175-184, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Polarization measurement, analysis, and applications V : 8-9 July 2002, Seattle, USA. pp.167-174, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Semiconductor and Organic Optoelectronic Materials and Devices. pp.259-267, 2000. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering