1.

Conference Proceedings
Conference Proceedings
1. Investigation of SiGe/Si - Heterostructures with High Resolution X-Ray Diffraction Methods
Frohberg, K. ; Wehner, B. ; Trui, B. ; Wolf, K. ; Paufler, P. ; Kuck, H.
Pub. info.: EPDIC 6 : proceedings of the sixth European Powder Diffraction Conference, held August 22-25, 1998 in Budapest, Hungary.  pp.457-462,  2000.  Zuerich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 321-324(1)
2.

Conference Proceedings
Conference Proceedings
2. Fabrication of SOI Substrates with Buried Silicide Layers for BiCMOS Applications
Wiemer, M. ; Zimmermann, S. ; Zhao, Q.T. ; Trui, B. ; Kaufmann, C. ; Mantl, S. ; Dudek, V. ; Gessner, T.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.303-310,  2005.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-02
3.

Conference Proceedings
Conference Proceedings
3. Effect of Heavy Doping on the Photoluminescence and Photoreflectance Spectra of Silicon and SiGe Layers
Bru-Chevallier, C. ; Trui, B. ; Souifi, A. ; Bremond, G. ; Guillot, G. ; Chroboczek, J. A.
Pub. info.: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.295-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 406