Bremond, G. ; Nouailhat, A. ; Guillot, G. ; Deveaud, B. ; Lambert, B. ; Toudic, Y. ; Clerjaud, B. ; Naud, C.
Pub. info.:
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.359-364, 1985. Pittsburgh, Pa.. Materials Research Society
Benyattou, T. ; Seghier, D. ; Bremond, G. ; Moneger, S. ; Kalboussi, A. ; Marrakchi, G. ; Guillot, G. ; Lhomer, C. ; Lambert, B. ; Toudic, Y. ; Corre A. Le
Pub. info.:
Rare earth doped semiconductors : symposium held April 13-15, 1993, San Francisco, California, U.S.A.. pp.163-, 1993. Pittsburgh, Pa.. MRS - Materials Research Society