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Conference Proceedings

1. Critical Behaviour of Metal-Insulator Transition in Manganites

Okuda, T. ; Tomioka, Y. ; Kuwahara, H. ; Asamitsu, A. ; Okimoto, Y. ; Tokura, Y.

Pub. info.:	Frontiers of high pressure research II: application of high pressure to low-dimensional novel electronic materials. pp.437-450, 2001. Dordrecht. Kluwer Academic Publishers
Title of ser.:	NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:	48

Conference Proceedings

2. Soft x-ray resonant diffraction in transition metal oxides [5932-80]

Thomas, K. J. ; Grenier, S. ; Hill, J. P. ; Chou, F. C. ; Tomioka, Y. ; Tokura, Y. ; Abbamonte, P.

Pub. info.:	Strongly correlated electron materials : physics and nanoengineering : 31 July-4 August, 2005, San Diego, California, USA. pp.59322A-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5932

Conference Proceedings

3. X-ray-Induced Insulator-Metal Transitions in CMR Manganites

Kiryukhin, V. ; Casa, D. ; Keimer, B. ; Hill, J. P. ; Vigliante, A. ; Tomioka, Y. ; Tokura, Y.

Pub. info.:	Science and technology of magnetic oxides : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A.. pp.65-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	494

Conference Proceedings

4. Phase Diagram and Anisotropic Transport Properties of Nd1-xSrxMnO3 Crystals

Kuwahara, H. ; Okuda, T. ; Tomioka, Y. ; Kimura, T. ; Asamitsu, A. ; Tokura, Y.

Pub. info.:	Science and technology of magnetic oxides : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A.. pp.83-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	494

Conference Proceedings

5. *Interplay of charge, orbital and magnetic order in Pr1-xCaxMnO3

Zimmermann, M. v. ; Hill, J. P. ; Gibbs, Doon ; Blume, M. ; Casa, D. ; Keimer, B. ; Murakami, Y. ; Tomioka, Y. ; Tokura, Y.

Pub. info.:	Applications of synchrotron radiation techniques to materials science V : sympoisum held November 29-December 3, 1999, Boston, Massachusetts, U.S.A.. pp.103-, 2000. Warrendale, Pa.. MRS-Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	590

Conference Proceedings

6. Magnetotransport Properties in Layered Manganite Crystals

Kimura, T. ; Tomioka, Y. ; Okuda, T. ; Kuwahara, H. ; Asamitsu, A. ; Tokura, Y.

Pub. info.:	Science and technology of magnetic oxides : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A.. pp.347-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	494

Conference Proceedings

7. Characterization of the Interfaces between SiC and Oxide Films by Spectroscopic Ellipsometry

Tomioka, Y. ; Iida, T. ; Midorikawa, M. ; Tukada, H. ; Yoshimoto, K. ; Hijikata, Y. ; Yaguchi, H. ; Yoshikawa, M. ; Ishida, Y. ; Kosugi, R. ; Yoshida, S.

Pub. info.:	Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001. pp.1029-1032, 2002. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	389-393

Conference Proceedings

8. The Investigation of 4H-SiC/SiO2 Interfaces by Optical and Electrical Measurements

Ishida, Y. ; Takahashi, T. ; Okumura, H. ; Jikimoto, T. ; Tsuchida, H. ; Yoshikawa, M. ; Tomioka, Y. ; Midorikawa, M. ; Hijikata, Y. ; Yoshida, S.

Pub. info.:	Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001. pp.1013-1016, 2002. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	389-393

Conference Proceedings

9. Characterization of the Interfaces between SiC and Oxide Films by Spectroscopic Ellipsometry

Tomioka, Y. ; Iida, T. ; Midorikawa, M. ; Tukada, H. ; Yoshimoto, K. ; Hijikata, Y. ; Yaguchi, H. ; Yoshikawa, M. ; Ishida, Y. ; Kosugi, R. ; Yoshida, S.

Pub. info.:	Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001. pp.1029-1032, 2002. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	389-393

10.

Conference Proceedings

10. The Investigation of 4H-SiC/SiO2 Interfaces by Optical and Electrical Measurements

Ishida, Y. ; Takahashi, T. ; Okumura, H. ; Jikimoto, T. ; Tsuchida, H. ; Yoshikawa, M. ; Tomioka, Y. ; Midorikawa, M. ; Hijikata, Y. ; Yoshida, S.

Pub. info.:	Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001. pp.1013-1016, 2002. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	389-393

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Author: Tomioka, Y.