1.

Conference Proceedings

Conference Proceedings
LoVecchio, P. ; Wong, K. ; Parodos, T. ; Tobin, S. P. ; Hutchins, M. A. ; Norton, P. W.
Pub. info.: Infrared detector materials and devices : 4-5 August 2004, Denver, Colorado, USA.  pp.65-72,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5564
2.

Conference Proceedings

Conference Proceedings
Reine, M. B. ; Tobin, S. P. ; Norton, P. W. ; LoVecchio, P.
Pub. info.: Infrared detector materials and devices : 4-5 August 2004, Denver, Colorado, USA.  pp.54-64,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5564
3.

Conference Proceedings

Conference Proceedings
Bunker, S. N. ; Sioshansi, P. ; Tobin, S. P.
Pub. info.: Materials modification and growth using Ion beams : symposium held April 21-23, 1987, Anaheim, California, U.S.A..  pp.125-130,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 93
4.

Conference Proceedings

Conference Proceedings
Bunker, S. N. ; Sioshansi, P. ; Sanfacon. M. M. ; Tobin, S. P.
Pub. info.: Materials modification and growth using Ion beams : symposium held April 21-23, 1987, Anaheim, California, U.S.A..  pp.391-396,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 93
5.

Conference Proceedings

Conference Proceedings
Drevinsky, P. J. ; Caefer, C. E. ; Tobin, S. P. ; Mikkelsen Jr., J. C. ; Kimerling, L. C.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.167-172,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
6.

Conference Proceedings

Conference Proceedings
Reine, M. B. ; Hairston, A. ; Lamarre, P. ; Wong, K. K. ; Tobin, S. P. ; Sood A K ; Cooke C ; Pophristic M ; Guo S ; Peres B ; Singh R ; Eddy Jr C R
Pub. info.: Semiconductor photodetectors III : 25 January 2006, San Jose California, USA.  pp.611901-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6119
7.

Conference Proceedings

Conference Proceedings
Tobin, S. P. ; Greenwald, A. C. ; Wolfson, R. G. ; Meier, D. L. ; Drevinsky, P. J.
Pub. info.: Impurity diffusion and gettering in silicon : symposium held November 27-30, 1984, Boston, Massachusetts, U.S.A..  pp.43-48,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 36
8.

Conference Proceedings

Conference Proceedings
Mitra, P. ; Case, F. C. ; Barnes, S. L. ; Reine, M. B. ; O'Dette, P. ; Tobin, S. P.
Pub. info.: Infrared applications of semiconductors II : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A..  pp.233-,  1998.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 484
9.

Conference Proceedings

Conference Proceedings
Vydyanath, H. R. ; Lamarre, P. ; Tobin, S. P. ; Hairston, A. W. ; Norton, P. W. ; Becker, L. S. R.
Pub. info.: Materials for infrared detectors III : 7-8 August 2003, San Diego, California, USA.  pp.33-57,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5209
10.

Conference Proceedings

Conference Proceedings
Reine, M. B. ; Tobin, S. P. ; Norton, P. W. ; LoVecchio, P.
Pub. info.: Infrared technology and applications XXXI : 28 March-1 April 2005, Orlando, Florida, USA.  pp.211-222,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5783