Advanced biomedical and clinical diagnostic systems : 26-28 January 2003, San Jose, California, USA. pp.109-117, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Tkaczyk, T.S. ; Dereniak, E.L. ; Gaalema, S. ; Bahn, W. ; Sun, S. ; Erickson, T. ; Rogers, J.D. ; Christenson, T.C. ; Richards-Kortum, R. ; Descour, M.R.
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Semiconductor photodetectors II : 25-26 January 2005, San Jose, California, USA. pp.77-84, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering