Mottin, E. ; Bain, A. ; Castelein, P. ; Ouvrier-Buffet, J.-L. ; Tissot, J.-L. ; Yon, J.-J.
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Photodetector materials and devices VII : 21-23 January 2002, San Jose, USA. pp.138-149, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Tissot, J.-L. ; Chatard, J.-P. ; Tinnes, S. ; Fieque, B.
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Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA. pp.396-401, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Tissot, J.-L. ; Astier, A. ; Chatard, J.-P. ; Tinnes, S. ; Trouilleau, C. ; Yon, J.-J.
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Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA. pp.511-517, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Crastes, A. ; Tissot, J.-L. ; Guimond, Y.M. ; Antonello, P.C. ; Leleve, J. ; Lenz, H.-J. ; Potet, P. ; Yon, J.-J.
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Detectors and associated signal processing : 1-2 October 2003, St. Etienne, France. pp.272-279, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fieque, B. ; Crastes, A. ; Legras, O. ; Tissot, J.-L.
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Infrared technology and applications XXXI : 28 March-1 April 2005, Orlando, Florida, USA. pp.531-538, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Trouilleau, C. ; Crastes, A. ; Tissot, J.-L. ; Chatard, J.-P. ; Yon, J.-J. ; Astier, A.
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Detectors and associated signal processing : 1-2 October 2003, St. Etienne, France. pp.129-135, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fieque, B. ; Crastes, A. ; Tissot, J.-L. ; Chatard, J.-P. ; Tinnes, S.
Pub. info.:
Detectors and associated signal processing : 1-2 October 2003, St. Etienne, France. pp.114-120, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering