1.

Conference Proceedings

Conference Proceedings
Tiginyanu, I. M. ; Kravetsky, I. V. ; Pavlidis, D. ; Eisenbach, A. ; Hildebrandt, R. ; Marowsky, G. ; Hartnagel, H. L.
Pub. info.: GaN and related alloys - 1999 : symposium held November 28-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.W11.52.1-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 595
2.

Conference Proceedings

Conference Proceedings
Tiginyanu, I. M. ; Irmer, G. ; Monecke, J. ; Hartnagel, H. L. ; Vogt, A. ; Schwab, C. ; Grob, J-J.
Pub. info.: Microcrystalline and nanocrystalline semiconductors--1998 : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A..  pp.99-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 536
3.

Conference Proceedings

Conference Proceedings
Tiginyanu, I. M. ; Kalceff, M. A. Stevens ; Sarua, A. ; Irmer, G. ; Monecke, J. ; Cojocari, O. ; Hartnagel, H. L.
Pub. info.: Optical microstructural characterization of semiconductors : sympoisum held November 29-30, 1999, Boston, Massachusetts, U.S.A..  pp.161-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 588
4.

Conference Proceedings

Conference Proceedings
Stevens-Kalceff, M. A. ; Langa, S. ; Tiginyanu, I. M. ; Carstensen, J. ; Christophersen, M. ; Foell, H.
Pub. info.: Microcrystalline and nanocrystalline semiconductors-2000 : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, PA..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 638
5.

Conference Proceedings

Conference Proceedings
Ursaki, V. V. ; Rusu, E. ; Zalamai, V. ; Sirbu, L. ; Monaico, E. ; Tiginyanu, I. M.
Pub. info.: Information Technologies 2004.  pp.148-155,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5822