1.

Conference Proceedings

Conference Proceedings
Schneider,J.M. ; Thonke,K. ; Ulrici,W. ; Sauer,R.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.323-328,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
2.

Conference Proceedings

Conference Proceedings
Presting,H. ; Konle,J. ; Hepp,M. ; Kibbel,H. ; Thonke,K. ; Sauer,R. ; Cabanski,W.A. ; Jaros,M.
Pub. info.: Silicon-based optoelectronics : 27-28 January 1999, San Jose, California.  pp.73-89,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3630
3.

Conference Proceedings

Conference Proceedings
Thonke,K. ; Pressel,K. ; Hermann,H.U. ; Domen,A.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.869-874,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
4.

Conference Proceedings

Conference Proceedings
Goser,R. ; Kreissl,J. ; Thonke,K. ; Ulrici,W.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1069-1074,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
5.

Conference Proceedings

Conference Proceedings
Thonke,K. ; Baier,T. ; Hamann,J. ; Scheerer,O. ; Sauer,R. ; Ulrici,W.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1521-1526,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
6.

Conference Proceedings

Conference Proceedings
Steck,S. ; Rtickert,G. ; Thonke,K. ; Ulrici,W. ; Sauer,R.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.731-736,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
7.

Conference Proceedings

Conference Proceedings
Ktrner,W. ; Sauer,R. ; Thonke,K. ; Asom,M.T. ; Zulehner,W.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part1  pp.159-164,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
8.

Conference Proceedings

Conference Proceedings
Komitzer,K. ; Mayer,M. ; Mundbrod,M. ; Thonke,K. ; Pelzmann,A. ; Kamp,M. ; Sauer,R.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1113-1118,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
9.

Conference Proceedings

Conference Proceedings
Schrepel,C. ; Scherz,U. ; Ulrici,W. ; Thonke,K.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1075-1080,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
10.

Conference Proceedings

Conference Proceedings
Stemschulte,H. ; Wahl,S. ; Thonke,K. ; Sauer,R. ; Ruf,T. ; Cardona,M. ; Anthony,T.R.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.757-762,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263