Thizy, C. ; Stockman, Y. ; Doyle, D. ; Lemaire, P. ; Houbrechts, Y. ; Georges, M. ; Mazzoli, A. ; Mazy, E. ; Tychon, I. ; Ulbrich, G.
Pub. info.:
Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany. pp.59650W-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Geroges, M.P. ; Thizy, C. ; Scauflaire, V. ; Ryhon, S. ; Pauliat, G. ; Lemaire, P. ; Rossen, G.
Pub. info.:
Speckle metrology 2003 : 18-20 June 2003, Trondheim, Norway. pp.250-255, 2003. Bellingham, Wash. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering