Blank Cover Image

Application of digital speckle photography for local strain analysis

Author(s):
Publication title:
Optical measurement systems for industrial inspection : 16-17 June 1999, Munich, Germany
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3824
Pub. Year:
1999
Page(from):
229
Page(to):
236
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819433107 [0819433101]
Language:
English
Call no.:
P63600/3824
Type:
Conference Proceedings

Similar Items:

Holstein,D., Hartmann,H.-J., Juptner,W.P.O.

SPIE-The International Society for Optical Engineering

Holstein, D., Aswendt, P., Hofling, R., Schmidt, C.D., Juptner, W.

SPIE--International Society for Optical Engineering

Holstein,D., Juptner,W.P.

SPIE-The International Society for Optical Engineering

U. Schnars, H.-J. Hartmann, W.P. Jüptner

Society of Photo-optical Instrumentation Engineers

Kebbel,V., Hartmann,H.-J., Juptner,W.P.O.

SPIE-The International Society for Optical Engineering

Kebbel,V., Hartmann,H.-J., Juptner,W.P.O.

SPIE-The International Society for Optical Engineering

Kalms,M.K., Osten,W., Juptner,W.P., Bisle,W., Scherling,D., Tober,G.

SPIE - The International Society for Optical Engineering

Alsen, J., von Kopylow, C., Juptner, W. P. O.

SPIE - The International Society of Optical Engineering

Kebbel,V., Hartmann,H.-J., Juptner,W.P.O.

SPIE - The International Society for Optical Engineering

Baumbach, T., Osten, W., von Kopylow, C., Juptner, W. P. O.

SPIE - The International Society of Optical Engineering

Juptner,W.P., Pomarico,J.A., Schnars,U.

SPIE-The International Society for Optical Engineering

Sjodahl,M., Synnergren,P., Johnson,P.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12