Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA. pp.60000K-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA. pp.60000R-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Tao, Y. ; Yelon, A. ; Sacher, E. ; Lu, Z.H. ; Graham, M.J.
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Chemical surface preparation, passivation, and cleaning for semiconductor growth and processing : symposium held April 27-29, 1992, San Francisco, California, U.S.A.. pp.293-298, 1992. Pittsburgh, Pa.. Materials Research Society
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Chemical surface preparation, passivation, and cleaning for semiconductor growth and processing : symposium held April 27-29, 1992, San Francisco, California, U.S.A.. pp.299-304, 1992. Pittsburgh, Pa.. Materials Research Society
Magnesium-science, technology and applications : proceedings of the International Conference on Magnesium-Science, Technology and Applications September 20-24, 2004, Beijing, China. pp.733-736, 2005. Uetikon-Zuerich, Switzerland. Trans Tech Publications
APOC 2001: Asia-Pacific Optical and Wireless Communications : optical network design and management : 13-15 November 2001, Beijing, Chaina. pp.177-183, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Tao, Y. ; Landheer, D. ; Hulse, J. E. ; Xu, D. -X. ; Quance, T.
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Ultraclean semiconductor processing technology and surface chemical cleaning and passivation : Symposum held April 17-19, 1995, San Francisco, California, USA. pp.255-, 1995. Pittsburgh, PA. MRS - Materials Research Society
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Laser-generated and other laboratory X-ray and EUV sources, optics, and applications : 4-6 August 2003, San Diego, California, USA. pp.289-297, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Electronic imaging and multimedia technology IV : 8-11 November 2004, Beijing, China. pp.22-33, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering