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14 results

Conference Proceedings

1. GRAZING INCIDENCE X-RAY REFLECTOMETRY STUDIES OF CADMIUM ARACHIDATE LANGMUIR-BLODGETT FILMS

Tanner, B. K. ; Bowen, D. K. ; Petty, M. C. ; Swaminathan, S. ; Grunfeld, F.

Pub. info.:	Interface dynamics and growth : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A.. pp.281-286, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	237

Conference Proceedings

2. PRINCIPLES AND PERFORMANCE OF A PC-BASED PROGRAM FOR SIMULATION OF GRAZING INCIDENCE X-RAY REFLECTIVITY PROFILES

Wormington, M. ; Bowen, D. K. ; Tanner, B. K.

Pub. info.:	Structure and properties of interfaces in materials : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A.. pp.119-126, 1992. Pittsburgh. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	238

Conference Proceedings

3. THERMAL DEGRADATION OF SiGe INTERFACES STUDIED BY X-RAY REFLECTIVITY AND DIFFRACTION

Hudson, , J. M. ; Powell, A. R. ; Bowen, D. K. ; Wormington, M. ; Tanner, B. K. ; Kubiak, R. A. ; Parker, E. H. C.

Pub. info.:	Thin films : stresses and mechanical properties III : symposium held December 2-5, 1991, Boston, Massachusetts, U.S.A.. pp.455-460, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	239

Conference Proceedings

4. DOUBLE CRYSTAL X-RAY DIFFRACTOMETRY AND TOPOGRAPHY OF GaAs/GaAlAs AND GaInAs/InP MULTI-LAYERS

Hill, M. J. ; Tanner, B. K. ; Halliwell, M. A. G.

Pub. info.:	Layered structures, epitaxy, and interfaces : symposium held November 26-30, 1984, Boston, Massachusetts, U.S.A.. pp.53-58, 1985. Pittsburgh. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	37

Conference Proceedings

5. INVESTIGATION OF THE HOMOGENEITY AND DEFECT STRUCTURE IN SEMI-INSULATING LEC GaAs SINGLE CRYSTALS BY SYNCHROTRON RADIATION DOUBLE CRYSTAL X-RAY TOPOGRAPHY

Barnett, Sx. J. ; Tanner, B. K. ; Brown, G. T.

Pub. info.:	Advanced photon and particle techniques for the characterization of defects in solids : symposium held November 27-29, 1984, Boston, Massachusetts, U.S.A.. pp.83-88, 1985. Pittsburgh. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	41

Conference Proceedings

6. A GRAZING INCIDENCE X-RAY REFLECTOMETER FOR RAPID NONDESTRUCTIVE CHARACTERIZATION OF THIN FILMS AND INTERFACES

Loxley, N. ; Monteiro, A. ; Cooke, M. L.. ; Bowen, D. K. ; Tanner, B. K.

Pub. info.:	Advanced III-V compound semiconductor growth, processing and devices : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A.. pp.219-224, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	240

Conference Proceedings

7. THE NUCLEATION AND PROPAGATION OF MISFIT DISLOCATIONS NEAR THE CRITICAL THICKNESS IN Ge-Si STRAINED EPILAYERS

Kvam, E. P. ; Eaglesham, D. J. ; Maher, D. M. ; Humphreys, C. J. ; Bean, J. C. ; Green, G. S. ; Tanner, B. K.

Pub. info.:	Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.623-628, 1988. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	104

Conference Proceedings

8. CHARACTERIZATION OF SUB-SURFACE STRUCTURES BY DOUBLE CRYSTAL X-RAY DIFFRACTION

Bowen, D. K. ; Hill, M. J. ; Tanner, B. K.

Pub. info.:	Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A.. pp.447-454, 1987. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	82

Conference Proceedings

9. Density and sp3 content in diamond-like carbon films by X-ray reflectivity and electron energy loss spectroscopy

Libassi, A. ; Ferrari, A. C. ; Stolojan, V. ; Tanner, B. K. ; Robertson, J. ; Brown, L. M.

Pub. info.:	Amorphous and nanostructured carbon : sympoisum held November 29-December 2, 1999, Boston, Massachusetts, U.S.A.. pp.293-, 2000. Warrendale, Pa.. MRS-Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	593

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Conference Proceedings

10. NEW ALGORITHMS FOR RAPID FULL-WAFER MAPPING BY HIGH RESOLUTION DOUBLE AXIS X-RAY DIFFRACTION

Loxley, N. ; Cockerton, S. ; Cooke, L. M. ; Gray, T. ; Tanner, B. K. ; Bowen, D. K.

Pub. info.:	Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A.. pp.451-, 1994. Pittsburgh. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	324

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