1.

Conference Proceedings

Conference Proceedings
Kristl,J.A. ; Tibaudo,C. ; Tang,K. ; Schroeder,J.W.
Pub. info.: Remote sensing of clouds and the atmosphere VI : 17-20 September 2001, Toulouse, France.  pp.270-276,  2001.  Bellingham, Wash.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4539
2.

Conference Proceedings

Conference Proceedings
Hildebrandt,J. ; Irving,C. ; Tang,K.
Pub. info.: Digital image storage and archiving systems : 25-26 October 1995, Philadelphia, Pennsylvania.  pp.78-88,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2606
3.

Conference Proceedings

Conference Proceedings
Tang,K. ; Gerla,M.
Pub. info.: Scalability and traffic control in IP networks : 22-24 August 2001, Denver, USA.  pp.109-120,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4526
4.

Conference Proceedings

Conference Proceedings
Hildebrandt,J. ; Irving,C. ; Tang,K.
Pub. info.: Digital image storage and archiving systems : 25-26 October 1995, Philadelphia, Pennsylvania.  pp.246-257,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2606
5.

Conference Proceedings

Conference Proceedings
Chen,C.H.W. ; Taranenko,N.I. ; Zhu,Y.F. ; Allman,S.L. ; Tang,K. ; Matteson,K.J. ; Chang,L.Y. ; Chung,C.N. ; Martin,S. ; Haff,L.
Pub. info.: Proceedings of ultrasensitive biochemical diagnostics : 31 January, 2 February 1996, San Jose, California.  pp.434-442,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2680
6.

Conference Proceedings

Conference Proceedings
Wu,N.M. ; Tang,K. ; Lin,J.H.
Pub. info.: Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II.  pp.238-247,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2874