1.

Conference Proceedings

Conference Proceedings
Guo, Y. ; Tang, X. ; Zhu, J. ; Du, J.
Pub. info.: Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA.  pp.58781G-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5878
2.

Conference Proceedings

Conference Proceedings
Wang, Q. ; Ma, A. ; Chen, S. ; Tang, X.
Pub. info.: Remote sensing of the marine environment : 15-17 November 2006, Goa, India.  pp.64061G-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6406
3.

Conference Proceedings

Conference Proceedings
Androulakis, J. ; Pcionek, R. ; Quarez E. ; Palchik, O. ; Kong, H. ; Uher, C. ; Dangelo, J.J. ; Hogan, T. ; Tang, X. ; Tritt, T. ; Kanatzidis, Mercouri G.
Pub. info.: Materials and technologies for direct thermal-to-electric energy conversion : symposium held November 28-December 2, 2005, Boston, Massachusetts, U.S.A..  pp.187-194,  2006.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 886
4.

Conference Proceedings

Conference Proceedings
Tang, X. ; Hsieh, J. ; Nilsen, R. A. ; Mcolash, S. M.
Pub. info.: Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA.  pp.63180P-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6318
5.

Conference Proceedings

Conference Proceedings
Tang, X. ; He, P. ; Yang, J.
Pub. info.: Optical design and testing II : 8-12 November 2004, Beijing, China.  pp.642-646,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5638
6.

Conference Proceedings

Conference Proceedings
Tao, H. ; Tang, X. ; Liu, J. ; Tian, J.
Pub. info.: Image processing and pattern recognition in remote sensing :25-27 October 2002, Hangzhou, China.  pp.264-269,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4898
7.

Conference Proceedings

Conference Proceedings
Ning, R. ; Tang, X. ; Conover, D.L.
Pub. info.: Medical Imaging 2002 : Physics of Medical Imaging : 24-26 February 2002, San Diego, California, USA.  pp.774-781,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4682
8.

Conference Proceedings

Conference Proceedings
Li, Y. ; Tang, X. ; Miranda, J. ; Sue, H. -J. ; Whitcomb, J. ; Bradley, W.
Pub. info.: ANTEC '99 Conference proceedings, New York City, May 2-6, 1999 : plastics bridging the millennia.  3  pp.3423-3427,  1999.  Brookfield Center, CT.  Society of Plastics Engineers, Inc. (SPE)
Title of ser.: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.: 45(3)
9.

Conference Proceedings

Conference Proceedings
Li, Y. ; Tang, X. ; Miranda, J. ; Sue, H. -J. ; Whitcomb, J. ; Bradley, W.
Pub. info.: ANTEC '99 Conference proceedings, New York City, May 2-6, 1999 : plastics bridging the millennia.  2  pp.3423-3427,  1999.  Brookfield Center, CT.  Society of Plastics Engineers, Inc. (SPE)
Title of ser.: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.: 45(2)
10.

Conference Proceedings

Conference Proceedings
Tao, H. ; Tang, X. ; Liu, J. ; Tian, J.
Pub. info.: Image processing and pattern recognition in remote sensing :25-27 October 2002, Hangzhou, China.  pp.259-263,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4898