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Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA. pp.63181T-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Kao, Y. C. ; Broekaert, T. P. E. ; Liu, H. Y. ; Tang, S. ; Ho, I. H. ; Stringfellow, G. B.
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