Search records | 東京工業大学附属図書館文献データベース

You can search for articles included in proceedings of international conferences and technical papers which Tokyo Tech Library holds.
Tokyo Tech members can obtain tables of contents of 17,000 foreign journals by SwetScan. Tokyo Tech Library does not cover all of them.
List of Searchable Databases

Clear Form

Search for other sites by same keyword(s).

CiNii Books

NDL Search

WebcatPlus

amazon

カーリル

WorldCat

Filter

Title:

Author:

ISBN / ISSN / Paper No:

Source Title:

Publisher:

Publication Year:

～

Clear Form

Type:

Conference Proceedings

Technical Paper

Academic Journal

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

38 results

Conference Proceedings

1. Shape-free coupling-hole-type CO2 laser with arbitrary beam pattern: application feasibility to micromachinery

Tanaka,S. ; Sato,H.

Pub. info.:	Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan. pp.474-477, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4416

Conference Proceedings

2. Measurements of Correlation-Induced Spectral Changes by Use of a Wave-Front Folded Interferometer,

Kamada,M. ; Tanaka,S. ; Ohtsuka,Y.

Pub. info.:	Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea. Part1 pp.309-310, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2778

Conference Proceedings

3. New coefficient for accuracy assessment of land-cover classification based on Kullback-Leibler information

Nishii,R. ; Tanaka,S.

Pub. info.:	Image and signal processing for remote sensing III : 23-25 September 1996, Taormina, Italy. pp.72-79, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2955

Conference Proceedings

4. Design method of triplet decision tree classifier with division-wait mechanism

Yoshikawa,M. ; Fujimura,S. ; Tanaka,S. ; Nishii,R.

Pub. info.:	Image and signal processing for remote sensing III : 23-25 September 1996, Taormina, Italy. pp.52-62, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2955

Conference Proceedings

5. Analysis of hydrological changes in lakes of Asian arid zone by satellite data

Nakayama,Y. ; Tanaka,S. ; Sugimura,T. ; Endo,K.

Pub. info.:	Earth surface remote sensing : 22-25 September 1997, London, UK. pp.201-210, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3222

Conference Proceedings

6. Hierarchical processing for accurate optical proximity correction for 1-Gb DRAM metal layers

Kobayashi,S. ; Uno,T. ; Yamamoto,K. ; Tanaka,S. ; Kotani,T. ; Inoue,S. ; Higurashi,H. ; Watanabe,S. ; Yano,M. ; Ohki,S. ; Tsunakawa,K.

Pub. info.:	Optical microlithography XII : 17-19 March 1999, Santa Clara, California. Part2 pp.614-621, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3679

Conference Proceedings

7. Surface characterization of superconductive Nd1Ba2Cu3Oy thin films using scanning probemicroscopes

Ting,W. ; Badaye,M. ; Itti,R. ; Morishita,T. ; Koshizuka,N. ; Tanaka,S.

Pub. info.:	Oxide superconductor physics and nano-engineering II : 30 January -2 February 1996, San Jose, California. pp.240-249, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2697

Conference Proceedings

8. Measurement of effective source shift using a grating-pinhole mask

Sato,K. ; Tanaka,S. ; Fujisawa,T. ; Inoue,S.

Pub. info.:	Optical microlithography XII : 17-19 March 1999, Santa Clara, California. Part1 pp.99-107, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3679

Conference Proceedings

9. Slope failure detection from temporal AVNIR images taken before and after the northwest Kagoshima-ken earthquake

Tanaka,S. ; Sugimura,T. ; Takatori,S. ; Komaki,Y.

Pub. info.:	Remote senging for earth science, ocean, and sea ice applications : 20-24 September 1999, Florence, Italy. pp.271-282, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3868

10.

Conference Proceedings

10. Mechanical properties of SiB6 addition of carbon sintered body

Tanaka,S. ; Fukushima,N. ; Matsushita,J. ; Akatsu,T. ; Niihara,K. ; Yasuda,E.

Pub. info.:	Smart materials. pp.346-354, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4234

38 results

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

Filtering by:

Author: Tanaka,S.