1.

Conference Proceedings
Conference Proceedings
1. Ion Implanted p+/n Diodes: Post-Implantation Annealing in a Silane Ambient in a Cold-Wall Low-Pressure CVD Reactor
Bergamini, F. ; Rao, S.P. ; Poggi, A. ; Tamarri, F. ; Saddow, S.E. ; Nipoti, R.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.819-822,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
2.

Conference Proceedings
Conference Proceedings
2. THE EVALUATION OF THE TRUE TEST TEMPERATURE DURING WAFER-LEVEL ELECTROMIGRATION TESTS
Baldini, G. L. ; Scorzoni, A. ; Tamarri, F. ; Trombetti, D.
Pub. info.: Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A..  pp.289-294,  1992.  Pittsburgh, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 265